SPRSP35K February   2019  – April 2024 DRA829J , DRA829J-Q1 , DRA829V , DRA829V-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
    1. 3.1 Functional Block Diagram
  5. 4 Device Comparison
    1. 4.1 Related Products
  6. 5 Terminal Configuration and Functions
    1. 5.1 Pin Diagram
    2. 5.2 Pin Attributes
    3. 5.3 Signal Descriptions
      1. 5.3.1  ADC
        1. 5.3.1.1 MCU Domain
      2. 5.3.2  DDRSS
        1. 5.3.2.1 MAIN Domain
      3. 5.3.3  GPIO
        1. 5.3.3.1 MAIN Domain
        2. 5.3.3.2 WKUP Domain
      4. 5.3.4  I2C
        1. 5.3.4.1 MAIN Domain
        2. 5.3.4.2 MCU Domain
        3. 5.3.4.3 WKUP Domain
      5. 5.3.5  I3C
        1. 5.3.5.1 MAIN Domain
        2. 5.3.5.2 MCU Domain
      6. 5.3.6  MCAN
        1. 5.3.6.1 MAIN Domain
        2. 5.3.6.2 MCU Domain
      7. 5.3.7  MCSPI
        1. 5.3.7.1 MAIN Domain
        2. 5.3.7.2 MCU Domain
      8. 5.3.8  UART
        1. 5.3.8.1 MAIN Domain
        2. 5.3.8.2 MCU Domain
        3. 5.3.8.3 WKUP Domain
      9. 5.3.9  MDIO
        1. 5.3.9.1 MCU Domain
      10. 5.3.10 CPSW2G
        1. 5.3.10.1 MCU Domain
      11. 5.3.11 CPSW9G
        1. 5.3.11.1 MAIN Domain
      12. 5.3.12 ECAP
        1. 5.3.12.1 MAIN Domain
      13. 5.3.13 EQEP
        1. 5.3.13.1 MAIN Domain
      14. 5.3.14 EHRPWM
        1. 5.3.14.1 MAIN Domain
      15. 5.3.15 USB
        1. 5.3.15.1 MAIN Domain
      16. 5.3.16 SERDES
        1. 5.3.16.1 MAIN Domain
      17. 5.3.17 OSPI
        1. 5.3.17.1 MCU Domain
      18. 5.3.18 Hyperbus
        1. 5.3.18.1 MCU Domain
      19. 5.3.19 GPMC
        1. 5.3.19.1 MAIN Domain
      20. 5.3.20 MMC
        1. 5.3.20.1 MAIN Domain
      21. 5.3.21 CPTS
        1. 5.3.21.1 MCU Domain
        2. 5.3.21.2 MAIN Domain
      22. 5.3.22 UFS
        1. 5.3.22.1 MAIN Domain
      23. 5.3.23 PRU_ICSSG [Currently Not Supported]
        1. 5.3.23.1 MAIN Domain
      24. 5.3.24 MCASP
        1. 5.3.24.1 MAIN Domain
      25. 5.3.25 DSS
        1. 5.3.25.1 MAIN Domain
      26. 5.3.26 DP
        1. 5.3.26.1 MAIN Domain
      27. 5.3.27 Camera Streaming Interface Receiver (CSI_RX_IF) Subsystem
        1. 5.3.27.1 MAIN Domain
      28. 5.3.28 DSI_TX
        1. 5.3.28.1 MAIN Domain
      29. 5.3.29 VPFE
        1. 5.3.29.1 MAIN Domain
      30. 5.3.30 DMTIMER
        1. 5.3.30.1 MAIN Domain
        2. 5.3.30.2 MCU Domain
      31. 5.3.31 Emulation and Debug
        1. 5.3.31.1 MAIN Domain
      32. 5.3.32 System and Miscellaneous
        1. 5.3.32.1 Boot Mode Configuration
          1. 5.3.32.1.1 MAIN Domain
          2. 5.3.32.1.2 MCU Domain
        2. 5.3.32.2 Clock
          1. 5.3.32.2.1 MAIN Domain
          2. 5.3.32.2.2 WKUP Domain
        3. 5.3.32.3 System
          1. 5.3.32.3.1 MAIN Domain
          2. 5.3.32.3.2 WKUP Domain
        4. 5.3.32.4 EFUSE
      33. 5.3.33 Power Supply
    4. 5.4 Pin Multiplexing
    5. 5.5 Pin Connectivity Requirements
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Power-On-Hour (POH) Limits
    4. 6.4 Recommended Operating Conditions
    5. 6.5 Operating Performance Points
    6. 6.6 Electrical Characteristics
      1. 6.6.1  I2C, Open-Drain, Fail-Safe (I2C OD FS) Electrical Characteristics
      2. 6.6.2  Fail-Safe Reset (FS Reset) Electrical Characteristics
      3. 6.6.3  HFOSC/LFOSC Electrical Characteristics
      4. 6.6.4  eMMCPHY Electrical Characteristics
      5. 6.6.5  SDIO Electrical Characteristics
      6. 6.6.6  CSI-2/DSI D-PHY Electrical Characteristics
      7. 6.6.7  ADC12B Electrical Characteristics
      8. 6.6.8  MLB LVCMOS Electrical Characteristics
      9. 6.6.9  LVCMOS Electrical Characteristics
      10. 6.6.10 USB2PHY Electrical Characteristics
      11. 6.6.11 SerDes 4-L-PHY/2-L-PHY Electrical Characteristics
      12. 6.6.12 UFS M-PHY Electrical Characteristics
      13. 6.6.13 eDP/DP AUX-PHY Electrical Characteristics
      14. 6.6.14 DDR0 Electrical Characteristics
    7. 6.7 VPP Specifications for One-Time Programmable (OTP) eFuses
      1. 6.7.1 Recommended Operating Conditions for OTP eFuse Programming
      2. 6.7.2 Hardware Requirements
      3. 6.7.3 Programming Sequence
      4. 6.7.4 Impact to Your Hardware Warranty
    8. 6.8 Thermal Resistance Characteristics
      1. 6.8.1 Thermal Resistance Characteristics for ALF Package
    9. 6.9 Timing and Switching Characteristics
      1. 6.9.1 Timing Parameters and Information
      2. 6.9.2 Power Supply Sequencing
        1. 6.9.2.1 Power Supply Slew Rate Requirement
        2. 6.9.2.2 Combined MCU and Main Domains Power-Up Sequencing
        3. 6.9.2.3 Combined MCU and Main Domains Power- Down Sequencing
        4. 6.9.2.4 Isolated MCU and Main Domains Power- Up Sequencing
        5. 6.9.2.5 Isolated MCU and Main Domains, Primary Power- Down Sequencing
        6. 6.9.2.6 Entry and Exit of MCU Only State
        7. 6.9.2.7 Entry and Exit of DDR Retention State
      3. 6.9.3 System Timing
        1. 6.9.3.1 Reset Timing
        2. 6.9.3.2 Safety Signal Timing
        3. 6.9.3.3 Clock Timing
      4. 6.9.4 Clock Specifications
        1. 6.9.4.1 Input and Output Clocks / Oscillators
          1. 6.9.4.1.1 WKUP_OSC0 Internal Oscillator Clock Source
            1. 6.9.4.1.1.1 Load Capacitance
            2. 6.9.4.1.1.2 Shunt Capacitance
          2. 6.9.4.1.2 WKUP_OSC0 LVCMOS Digital Clock Source
          3. 6.9.4.1.3 Auxiliary OSC1 Internal Oscillator Clock Source
            1. 6.9.4.1.3.1 Load Capacitance
            2. 6.9.4.1.3.2 Shunt Capacitance
          4. 6.9.4.1.4 Auxiliary OSC1 LVCMOS Digital Clock Source
          5. 6.9.4.1.5 Auxiliary OSC1 Not Used
          6. 6.9.4.1.6 WKUP_LFOSC0 Internal Oscillator Clock Source
            1. 6.9.4.1.6.1 WKUP_LFOSC0 Not Used
        2. 6.9.4.2 Output Clocks
        3. 6.9.4.3 PLLs
        4. 6.9.4.4 Module and Peripheral Clocks Frequencies
      5. 6.9.5 Peripherals
        1. 6.9.5.1  ATL
          1. 6.9.5.1.1 ATL_PCLK Timing Requirements
          2. 6.9.5.1.2 ATL_AWS[x] Timing Requirements
          3. 6.9.5.1.3 ATL_BWS[x] Timing Requirements
          4. 6.9.5.1.4 ATCLK[x] Switching Characteristics
        2. 6.9.5.2  VPFE
        3. 6.9.5.3  CPSW2G
          1. 6.9.5.3.1 CPSW2G MDIO Interface Timings
          2. 6.9.5.3.2 CPSW2G RMII Timings
            1. 6.9.5.3.2.1 CPSW2G RMII[x]_REF_CLK Timing Requirements – RMII Mode
            2. 6.9.5.3.2.2 CPSW2G RMII[x]_RXD[1:0], RMII[x]_CRS_DV, and RMII[x]_RX_ER Timing Requirements – RMII Mode
            3. 6.9.5.3.2.3 CPSW2G RMII[x]_TXD[1:0], and RMII[x]_TX_EN Switching Characteristics – RMII Mode
          3. 6.9.5.3.3 CPSW2G RGMII Timings
            1. 6.9.5.3.3.1 RGMII[x]_RXC Timing Requirements – RGMII Mode
            2. 6.9.5.3.3.2 CPSW2G Timing Requirements for RGMII[x]_RD[3:0], and RGMII[x]_RCTL – RGMII Mode
            3. 6.9.5.3.3.3 CPSW2G RGMII[x]_TXC Switching Characteristics – RGMII Mode
            4. 6.9.5.3.3.4 RGMII[x]_TD[3:0], and RGMII[x]_TX_CTL Switching Characteristics – RGMII Mode
        4. 6.9.5.4  CPSW9G
          1. 6.9.5.4.1 CPSW9G MDIO Interface Timings
          2. 6.9.5.4.2 CPSW9G RMII Timings
            1. 6.9.5.4.2.1 RMII[x]_REF_CLK Timing Requirements – RMII Mode
            2. 6.9.5.4.2.2 RMII[x]_RXD[1:0], RMII[x]_CRS_DV, and RMII[x]_RX_ER Timing Requirements – RMII Mode
            3. 6.9.5.4.2.3 RMII[x]_TXD[1:0], and RMII[x]_TXEN Switching Characteristics – RMII Mode
          3. 6.9.5.4.3 CPSW9G RGMII Timings
            1. 6.9.5.4.3.1 RGMII[x]_RXC Timing Requirements – RGMII Mode
            2. 6.9.5.4.3.2 RGMII[x]_RD[3:0] and RGMII[x]_RCTL Timing Requirements – RGMII Mode
            3. 6.9.5.4.3.3 RGMII[x]_TXC Switching Characteristics – RGMII Mode
            4. 6.9.5.4.3.4 RGMII[x]_TD[3:0] and RGMII[x]_TX_CTL Switching Characteristics – RGMII Mode
        5. 6.9.5.5  CSI-2
        6. 6.9.5.6  DDRSS
        7. 6.9.5.7  DSS
        8. 6.9.5.8  eCAP
          1. 6.9.5.8.1 Timing Requirements for eCAP
          2. 6.9.5.8.2 Switching Characteristics for eCAP
        9. 6.9.5.9  EPWM
          1. 6.9.5.9.1 Timing Requirements for eHRPWM
          2. 6.9.5.9.2 Switching Characteristics for eHRPWM
        10. 6.9.5.10 eQEP
          1. 6.9.5.10.1 Timing Requirements for eQEP
          2. 6.9.5.10.2 Switching Characteristics for eQEP
        11. 6.9.5.11 GPIO
          1. 6.9.5.11.1 GPIO Timing Requirements
          2. 6.9.5.11.2 GPIO Switching Characteristics
        12. 6.9.5.12 GPMC
          1. 6.9.5.12.1 GPMC and NOR Flash — Synchronous Mode
            1. 6.9.5.12.1.1 GPMC and NOR Flash Timing Requirements — Synchronous Mode
            2. 6.9.5.12.1.2 GPMC and NOR Flash Switching Characteristics – Synchronous Mode
          2. 6.9.5.12.2 GPMC and NOR Flash — Asynchronous Mode
            1. 6.9.5.12.2.1 GPMC and NOR Flash Timing Requirements – Asynchronous Mode
            2. 6.9.5.12.2.2 GPMC and NOR Flash Switching Characteristics – Asynchronous Mode
          3. 6.9.5.12.3 GPMC and NAND Flash — Asynchronous Mode
            1. 6.9.5.12.3.1 GPMC and NAND Flash Timing Requirements – Asynchronous Mode
            2. 6.9.5.12.3.2 GPMC and NAND Flash Switching Characteristics – Asynchronous Mode
          4. 6.9.5.12.4 GPMC0 IOSET
        13. 6.9.5.13 HyperBus
          1. 6.9.5.13.1 Timing Requirements for HyperBus
          2. 6.9.5.13.2 HyperBus 166 MHz Switching Characteristics
          3. 6.9.5.13.3 HyperBus 100 MHz Switching Characteristics
        14. 6.9.5.14 I2C
        15. 6.9.5.15 I3C
        16. 6.9.5.16 MCAN
        17. 6.9.5.17 MCASP
        18. 6.9.5.18 MCSPI
          1. 6.9.5.18.1 MCSPI — Master Mode
          2. 6.9.5.18.2 MCSPI — Slave Mode
        19. 6.9.5.19 MMCSD
          1. 6.9.5.19.1 MMC0 - eMMC Interface
            1. 6.9.5.19.1.1 Legacy SDR Mode
            2. 6.9.5.19.1.2 High Speed SDR Mode
            3. 6.9.5.19.1.3 High Speed DDR Mode
            4. 6.9.5.19.1.4 HS200 Mode
          2. 6.9.5.19.2 MMC1/2 - SD/SDIO Interface
            1. 6.9.5.19.2.1 Default Speed Mode
            2. 6.9.5.19.2.2 High Speed Mode
            3. 6.9.5.19.2.3 UHS–I SDR12 Mode
            4. 6.9.5.19.2.4 UHS–I SDR25 Mode
            5. 6.9.5.19.2.5 UHS–I SDR50 Mode
            6. 6.9.5.19.2.6 UHS–I DDR50 Mode
            7. 6.9.5.19.2.7 UHS–I SDR104 Mode
        20. 6.9.5.20 CPTS
          1. 6.9.5.20.1 CPTS Timing Requirements
          2. 6.9.5.20.2 CPTS Switching Characteristics
        21. 6.9.5.21 OSPI
          1. 6.9.5.21.1 OSPI PHY Mode
            1. 6.9.5.21.1.1 OSPI With Data Training
              1. 6.9.5.21.1.1.1 OSPI Switching Characteristics – Data Training
            2. 6.9.5.21.1.2 OSPI Without Data Training
              1. 6.9.5.21.1.2.1 OSPI Timing Requirements – SDR Mode
              2. 6.9.5.21.1.2.2 OSPI Switching Characteristics – SDR Mode
              3. 6.9.5.21.1.2.3 OSPI Timing Requirements – DDR Mode
              4. 6.9.5.21.1.2.4 OSPI Switching Characteristics – DDR Mode
          2. 6.9.5.21.2 OSPI Tap Mode
            1. 6.9.5.21.2.1 OSPI Tap SDR Timing
            2. 6.9.5.21.2.2 OSPI Tap DDR Timing
        22. 6.9.5.22 PCIE
        23. 6.9.5.23 Timers
          1. 6.9.5.23.1 Timing Requirements for Timers
          2. 6.9.5.23.2 Switching Characteristics for Timers
        24. 6.9.5.24 UART
          1. 6.9.5.24.1 Timing Requirements for UART
          2. 6.9.5.24.2 UART Switching Characteristics
        25. 6.9.5.25 USB
      6. 6.9.6 Emulation and Debug
        1. 6.9.6.1 Trace
        2. 6.9.6.2 JTAG
          1. 6.9.6.2.1 JTAG Electrical Data and Timing
            1. 6.9.6.2.1.1 JTAG Timing Requirements
            2. 6.9.6.2.1.2 JTAG Switching Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Processor Subsystems
      1. 7.2.1 Arm Cortex-A72
      2. 7.2.2 Arm Cortex-R5F
      3. 7.2.3 DSP C71x
      4. 7.2.4 DSP C66x
    3. 7.3 Accelerators and Coprocessors
      1. 7.3.1 GPU
      2. 7.3.2 D5520MP2
      3. 7.3.3 VXE384MP2
    4. 7.4 Other Subsystems
      1. 7.4.1 MSMC
      2. 7.4.2 NAVSS
        1. 7.4.2.1 NAVSS0
        2. 7.4.2.2 MCU_NAVSS
      3. 7.4.3 PDMA Controller
      4. 7.4.4 Power Supply
      5. 7.4.5 Peripherals
        1. 7.4.5.1  ADC
        2. 7.4.5.2  ATL
        3. 7.4.5.3  CSI
          1. 7.4.5.3.1 Camera Streaming Interface Receiver (CSI_RX_IF) and MIPI DPHY Receiver (DPHY_RX)
          2. 7.4.5.3.2 Camera Streaming Interface Transmitter (CSI_TX_IF)
        4. 7.4.5.4  CPSW2G
        5. 7.4.5.5  CPSW9G
        6. 7.4.5.6  DCC
        7. 7.4.5.7  DDRSS
        8. 7.4.5.8  DSS
          1. 7.4.5.8.1 DSI
          2. 7.4.5.8.2 eDP
        9. 7.4.5.9  VPFE
        10. 7.4.5.10 eCAP
        11. 7.4.5.11 EPWM
        12. 7.4.5.12 ELM
        13. 7.4.5.13 ESM
        14. 7.4.5.14 eQEP
        15. 7.4.5.15 GPIO
        16. 7.4.5.16 GPMC
        17. 7.4.5.17 Hyperbus
        18. 7.4.5.18 I2C
        19. 7.4.5.19 I3C
        20. 7.4.5.20 MCAN
        21. 7.4.5.21 MCASP
        22. 7.4.5.22 MCRC Controller
        23. 7.4.5.23 MCSPI
        24. 7.4.5.24 MMC/SD
        25. 7.4.5.25 OSPI
        26. 7.4.5.26 PCIE
        27. 7.4.5.27 SerDes
        28. 7.4.5.28 WWDT
        29. 7.4.5.29 Timers
        30. 7.4.5.30 UART
        31. 7.4.5.31 USB
        32. 7.4.5.32 UFS
  9. 8 Applications and Implementation
    1. 8.1 Power Supply Mapping
    2. 8.2 Device Connection and Layout Fundamentals
      1. 8.2.1 Power Supply Decoupling and Bulk Capacitors
        1. 8.2.1.1 Power Distribution Network Implementation Guidance
      2. 8.2.2 External Oscillator
      3. 8.2.3 JTAG and EMU
      4. 8.2.4 Reset
      5. 8.2.5 Unused Pins
      6. 8.2.6 Hardware Design Guide for JacintoTM 7 Devices
    3. 8.3 Peripheral- and Interface-Specific Design Information
      1. 8.3.1 LPDDR4 Board Design and Layout Guidelines
      2. 8.3.2 OSPI and QSPI Board Design and Layout Guidelines
        1. 8.3.2.1 No Loopback and Internal Pad Loopback
        2. 8.3.2.2 External Board Loopback
        3. 8.3.2.3 DQS (only available in Octal Flash devices)
      3. 8.3.3 SERDES REFCLK Design Guidelines
      4. 8.3.4 USB VBUS Design Guidelines
      5. 8.3.5 System Power Supply Monitor Design Guidelines
      6. 8.3.6 High Speed Differential Signal Routing Guidance
      7. 8.3.7 Thermal Solution Guidance
  10. 9 Device and Documentation Support
    1. 9.1 Device Nomenclature
      1. 9.1.1 Standard Package Symbolization
      2. 9.1.2 Device Naming Convention
    2. 9.2 Tools and Software
    3. 9.3 Documentation Support
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Packaging Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • ALF|827
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.3.5 System Power Supply Monitor Design Guidelines

The VMON_ER_VSYS pin provides a way to monitor a system power supply. This system power supply is typically a single pre-regulated power source for the entire system. This supply is monitored by comparing the output of an external voltage divider circuit sourced by this supply with an internal voltage reference, with a power fail event being triggered when the voltage applied to VMON_ER_VSYS drops below the internal reference voltage. The actual system power supply voltage trip point is determined by the system designer when selecting component values used to implement the external resistor voltage divider circuit. When designing the resistor divider circuit it is important to understand various factors which contribute to variability in the system power supply monitor trip point. The first thing to consider is the initial accuracy of the VMON_ER_VSYS input threshold which has a nominal value of 0.45 V, with a variation of ±3%. Precision 1% resistors with similar thermal coefficient are recommended for implementing the resistor voltage divider. This minimizes variability contributed by resistor value tolerances. Input leakage current associated with VMON_ER_VSYS must also be considered since any current flowing into the pin creates a loading error on the voltage divider output. The VMON_ER_VSYS input leakage current may be in the range of 10 nA to 2.5 μA when applying 0.45 V.

Note:

The resistor voltage divider shall be designed such that its output voltage never exceeds themaximum value defined in Section 6.4 , Recommended Operating Conditions during normal operating conditions.

Figure 8-5 presents an example, where the system power supply is nominally 5 V and the maximum trigger threshold is 5 V - 10%, or 4.5 V.

For this example, it is important to understand which variables effect the maximum trigger threshold when selecting resistor values. It is obvious a device which has a VMON_ER_VSYS input threshold of 0.45 V + 3% needs to be considered when trying to design a voltage divider that doesn’t trip until the system supply drops 10%. The effect of resistor tolerance and input leakage also needs to be considered, but how these contributions effect the maximum trigger point may not be obvious. When selecting component values which produce a maximum trigger voltage, the system designer must consider a condition where the value of R1 is 1% low and the value of R2 is 1% high combined with a condition where input leakage current for the VMON_ER_VSYS pin is 2.5 μA. When implementing a resistor divider where R1 = 4.81 KΩ and R2 = 40.2 KΩ, the result is a maximum trigger threshold of 4.523 V.

Once component values have been selected to satisfy the maximum trigger voltage as described above, the system designer can determine the minimum trigger voltage by calculating the applied voltage that produces an output voltage of 0.45 V - 3% when the value of R1 is 1% high and the value of R2 is 1% low, and the input leakage current is 10 nA, or zero. Using an input leakage of zero with the resistor values given above, the result is a minimum trigger threshold of 4.008 V.

This example demonstrates a system power supply voltage trip point that ranges from 4.008 V to 4.523 V. Approximately 250 mV of this range is introduced by VMON_ER_VSYS input threshold accuracy of ±3%, approximately 150 mV of this range is introduced by resistor tolerance of ±1%, and approximately 100 mV of this range is introduced by loading error when VMON_ER_VSYS input leakage current is 2.5 μA.

The resistor values selected in this example produces approximately 100 μA of bias current through the resistor divider when the system supply is 4.5 V. The 100 mV of loading error mentioned above could be reduced to about 10 mV by increasing the bias current through the resistor divider to approximately 1 mA. So resistor divider bias current vs loading error is something the system designer needs to consider when selecting component values.

The system designer should also consider implementing a noise filter on the voltage divider output since VMON_ER_VSYS has minimum hysteresis and a high-bandwidth response to transients. This could be done by installing a capacitor across R1 as shown in Figure 8-5. However, the system designer must determine the response time of this filter based on system supply noise and expected response to transient events.

Figure 8-5 presents an example, when the system power supply voltage is nominally 5 V and the desired trigger threshold is -10% or 4.5 V.

GUID-477DA8FD-750E-43E0-ACEE-2B98E0742725-low.gifFigure 8-5 System Supply Monitor Voltage Divider Circuit