SLVSHE3 June 2024 DRV2911-Q1
PRODUCTION DATA
If the die temperature near FET exceeds the trip point of the thermal shutdown limit (TTSD_FET), all the FETs are disabled, the charge pump is shut down, and the FAULTZ pin is driven low. Normal operation starts again (driver operation and the FAULTZ pin is released) when the over temperature condition clears. This protection feature cannot be disabled.