SLVSH58 August   2024 DRV81004-Q1

ADVANCE INFORMATION  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
      1. 5.5.1 SPI Timing Requirements
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Control Pins
        1. 6.3.1.1 Input Pins
        2. 6.3.1.2 nSLEEP Pin
      2. 6.3.2 Power Supply
        1. 6.3.2.1 Modes of Operation
          1. 6.3.2.1.1 Power-up
          2. 6.3.2.1.2 Sleep mode
          3. 6.3.2.1.3 Idle mode
          4. 6.3.2.1.4 Active mode
          5. 6.3.2.1.5 Limp Home mode
          6. 6.3.2.1.6 Reset condition
      3. 6.3.3 Power Stage
        1. 6.3.3.1 Switching Resistive Loads
        2. 6.3.3.2 Inductive Output Clamp
        3. 6.3.3.3 Maximum Load Inductance
        4. 6.3.3.4 Switching Channels in parallel
      4. 6.3.4 Protection and Diagnostics
        1. 6.3.4.1 Undervoltage on VM
        2. 6.3.4.2 Overcurrent Protection
        3. 6.3.4.3 Over Temperature Protection
        4. 6.3.4.4 Over Temperature Warning
        5. 6.3.4.5 Over Temperature and Overcurrent Protection in Limp Home mode
        6. 6.3.4.6 Reverse Polarity Protection
        7. 6.3.4.7 Over Voltage Protection
        8. 6.3.4.8 Output Status Monitor
      5. 6.3.5 SPI Communication
        1. 6.3.5.1 SPI Signal Description
          1. 6.3.5.1.1 Chip Select (nSCS)
            1. 6.3.5.1.1.1 Logic high to logic low Transition
            2. 6.3.5.1.1.2 Logic low to logic high Transition
          2. 6.3.5.1.2 Serial Clock (SCLK)
          3. 6.3.5.1.3 Serial Input (SDI)
          4. 6.3.5.1.4 Serial Output (SDO)
        2. 6.3.5.2 Daisy Chain Capability
        3. 6.3.5.3 SPI Protocol
        4. 6.3.5.4 SPI Registers
          1. 6.3.5.4.1  Standard Diagnosis Register
          2. 6.3.5.4.2  Output control register
          3. 6.3.5.4.3  Input 0 Mapping Register
          4. 6.3.5.4.4  Input 1 Mapping Register
          5. 6.3.5.4.5  Input Status Monitor Register
          6. 6.3.5.4.6  Open Load Current Control Register
          7. 6.3.5.4.7  Output Status Monitor Register
          8. 6.3.5.4.8  Configuration Register
          9. 6.3.5.4.9  Output Clear Latch Register
          10. 6.3.5.4.10 Configuration Register 2
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1 Typical Application
      2. 7.1.2 Suggested External Components
    2. 7.2 Layout
      1. 7.2.1 Layout Guidelines
      2. 7.2.2 Package Footprint Compatibility
  9. 8 Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
    2. 8.2 Support Resources
    3. 8.3 Trademarks
    4. 8.4 Electrostatic Discharge Caution
    5. 8.5 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

5.4 Thermal Information

THERMAL METRIC

PWP (HTSSOP)

UNIT

14 PINS

R θJAJunction-to-ambient thermal resistance

43

°C/W
R θJC(top)Junction-to-case (top) thermal resistance

44.5

°C/W
R θJBJunction-to-board thermal resistance

21

°C/W
ψ JTJunction-to-top characterization parameter

3.6

°C/W
ψ JBJunction-to-board characterization parameter

20.9

°C/W
R θJC(bot)Junction-to-case (bottom) thermal resistance

10.1

°C/W
  • For more information about traditional and new thermal metrics, see the Semiconductor and IC package thermal metrics application report.
  • °C/W = degrees Celsius per watt.
  • These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC value, which is based on a JEDEC-defined 1S0P system) and will change based on environment as well as application. Power dissipation of 2 W and an ambient temperature of 70°C is assumed. For more information, see these EIA/JEDEC standards:
    • JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
    • JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
    • JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
    • JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements