SLVSE12A March 2018 – April 2019 DRV8343-Q1
PRODUCTION DATA.
When the EN_SHT_TST bit is set high, all the pulldown current sources on the DLx pins are enabled. The voltage across each pulldown source is individually measured and compared to an internal threshold (VTH). If the voltage across any of the current sources exceeds VTH, the DRV8343-Q1 device flags that as a fault condition. The nFAULT pin is driven low, and in the SPI device the FAULT, OL_SHT, and the corresponding SHT_BAT_x bit is set. Figure 41 shows the internal circuit for the short to battery detection.
In the SPI device, depending on the load configuration, SHT_BAT on one phase can latch all three SHT_BAT_x bits high. To determine which phase has a short-to-supply fault condition, the external MOSFETs can be enabled and the appropriate VDS_Lx fault bit is latched indicating the faulty phase node. SHT_BAT is not supported for load configurations shown in Figure 39.