SLVSDR9E October 2016 – January 2021 DRV8702-Q1 , DRV8703-Q1
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
The dead time (t(DEAD)) is measured as the time when the SHx pin is in the Hi-Z state between turning off one of the H-bridge FETs and turning on the other. For example, the output is Hi-Z between turning off the high-side FET and turning on the low-side FET.
The dead time consists of an inserted digital dead time and FET gate slewing. The DRV8702-Q1 device has a digital dead time of approximately 240 ns. The DRV8703-Q1 device has programmable dead-time options of 120, 240, 480, 960 ns. In addition to this digital dead time, the output is Hi-Z as long as the voltage across the GLx pin to ground or GHx pin to SHx pin is less than the FET threshold voltage.
The total dead time is dependent on the IDRIVE resistor setting because a portion of the FET gate ramp (GHx and GLx pins) includes the observable dead time.