SNLS398H January   2012  – February 2018 DS125DF410

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Typical Application Diagram
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Device Data Path Operation
      2. 7.3.2 Signal Detect
      3. 7.3.3 CTLE
      4. 7.3.4 DFE
      5. 7.3.5 Clock and Data Recovery
      6. 7.3.6 Output Driver
      7. 7.3.7 Device Configuration
        1. 7.3.7.1 Rate and Subrate Setting
    4. 7.4 Device Functional Modes
      1. 7.4.1 SMBus Master Mode and SMBus Slave Mode
      2. 7.4.2 Address Lines <ADDR_[3:0]>
      3. 7.4.3 SDA and SDC
      4. 7.4.4 Standards-Based Modes
        1. 7.4.4.1 Ref_mode 3 Mode (Reference Clock Required)
        2. 7.4.4.2 False Lock Detector Setting
        3. 7.4.4.3 Reference Clock In
        4. 7.4.4.4 Reference Clock Out
        5. 7.4.4.5 Driver Output Voltage
        6. 7.4.4.6 Driver Output De-Emphasis
        7. 7.4.4.7 Driver Output Rise/Fall Time
        8. 7.4.4.8 INT
        9. 7.4.4.9 LOCK_3, LOCK_2, LOCK_1, and LOCK_0
    5. 7.5 Programming
      1. 7.5.1  SMBus Strap Observation
      2. 7.5.2  Device Revision and Device ID
      3. 7.5.3  Control/Shared Register Reset
      4. 7.5.4  Interrupt Channel Flag Bits
      5. 7.5.5  SMBus Master Mode Control Bits
      6. 7.5.6  Resetting Individual Channels of the Retimer
      7. 7.5.7  Interrupt Status
      8. 7.5.8  Overriding the CTLE Boost Setting
      9. 7.5.9  Overriding the VCO Search Values
      10. 7.5.10 Overriding the Output Multiplexer
      11. 7.5.11 Overriding the VCO Divider Selection
      12. 7.5.12 Using the PRBS Generator
      13. 7.5.13 Using the Internal Eye Opening Monitor
      14. 7.5.14 Overriding the DFE Tap Weights and Polarities
      15. 7.5.15 Enabling Slow Rise/Fall Time on the Output Driver
      16. 7.5.16 Inverting the Output Polarity
      17. 7.5.17 Overriding the Figure of Merit for Adaptation
      18. 7.5.18 Setting the Rate and Subrate for Lock Acquisition
      19. 7.5.19 Setting the Adaptation/Lock Mode
      20. 7.5.20 Initiating Adaptation
      21. 7.5.21 Setting the Reference Enable Mode
      22. 7.5.22 Overriding the CTLE Settings Used for CTLE Adaptation
      23. 7.5.23 Setting the Output Differential Voltage
      24. 7.5.24 Setting the Output De-Emphasis Setting
    6. 7.6 Register Maps
      1. 7.6.1 Register Information
      2. 7.6.2 Bit Fields in the Register Set
      3. 7.6.3 Writing to and Reading from the Control/Shared Registers
      4. 7.6.4 Channel Select Register
      5. 7.6.5 Reading to and Writing from the Channel Registers
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Trademarks
    3. 11.3 Electrostatic Discharge Caution
    4. 11.4 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.1 Absolute Maximum Ratings(1)(2)

MINMAXUNIT
Supply Voltage (VDD) –0.5 2.75 V
2.5 I/O Voltage (LVCMOS and Analog) –0.5 2.75 V
3.3 LVCMOS I/O Voltage (SDA, SDC, INT) –0.5 4.0 V
Signal Input Voltage (RXPn, RXNn) –0.5 2.75 V
Signal Output Voltage (TXPn, TXNn) –0.5 2.75 V
Junction Temperature 150 °C
Storage temperature, Tstg –65 150 °C
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur, including inoperability and degradation of device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating Conditions indicate conditions at which the device is functional and the device should not be operated outside these conditions.
(2) For soldering specifications: see SNOA549