SNLS477D October 2014 – February 2022 DS90UB948-Q1
PRODUCTION DATA
The deserializer supports the internal pattern generation feature. It allows basic testing and debugging of an integrated panel. The test patterns are simple and repetitive and allow for a quick visual verification of panel operation. As long as the device is not in power down mode, the test pattern is displayed even if no parallel input is applied. If no PCLK is received, the test pattern can be configured to use a programmed oscillator frequency. For detailed information, refer to Exploring the Int Test Pattern Generation Feature of FPDLink III IVI Devices (SNLA132).