SLVSHP4 February 2024 ESD652
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VRWM | Reverse stand-off voltage | IIO < 50nA | -18 | 18 | V | |
ILEAK | Leakage current at VRWM | VIO = ±18V, I/O to GND | 1 | 50 | nA | |
VBR | Breakdown voltage, I/O to GND (1) | IIO = ±10mA | 19 | 25 | V | |
VCLAMP | Surge clamping voltage, tp = 8/20µs (2) | IPP = ±1A, I/O to GND | 22 | 25 | V | |
IPP = ±5.5A, I/O to GND | 25 | 32 | V | |||
VCLAMP | TLP clamping voltage, tp = 100ns (3) | IPP = ±16A TLP, I/O to GND | 28 | V | ||
RDYN | Dynamic resistance (4) | I/O to GND | 0.32 | Ω | ||
GND to I/O | 0.32 | |||||
CLINE | Line capacitance, IO to GND | VIO = 0V, f = 1MHz | 4 | pF |