PARAMETER(1) | TEST CONDITIONS | MIN | TYP | MAX | UNIT |
---|
Program Time(2) | 128 data bits + 16 ECC bits | | | 40 | 300 | µs |
16K sector | | | 160 | 320 | ms |
64K sector | | | 640 | 1280 | ms |
Erase Time(3) at < 25 cycles | 16K sector | | | 25 | 50 | ms |
64K sector | | | 35 | 60 |
Erase Time(3) at 50k cycles | 16K sector | | | 115 | 4000 | ms |
64K sector | | | 130 | 4000 |
IDDP(4)(5) | VDD current consumption during Erase/Program cycle | VREG disabled | | 105 | | mA |
IDDIOP(4)(5) | VDDIO current consumption during Erase/Program cycle | | 55 | |
IDDIOP(4)(5) | VDDIO current consumption during Erase/Program cycle | VREG enabled | | 195 | | mA |
(1) The on-chip flash memory is in an erased state when the device is shipped from TI. As such, erasing the flash memory is not required before programming, when programming the device for the first time. However, the erase operation is needed on all subsequent programming operations.
(2) Program time includes overhead of the Flash state machine but does not include the time to transfer the following into RAM:
- Code that uses Flash API to program the Flash
- Flash API itself
- Flash data to be programmed
In other words, the time indicated in this table is applicable after all the required code/data is available in the device RAM, ready for programming. The transfer time will significantly vary depending on the speed of the JTAG debug probe used.
Program time calculation is based on programming 144 bits at a time at the specified operating frequency. Program time includes Program verify by the CPU. The program time does not degrade with write/erase (W/E) cycling, but the erase time does.
Erase time includes Erase verify by the CPU and does not involve any data transfer.
(3) Erase time includes Erase verify by the CPU.
(4) Typical parameters as seen at room temperature including function call overhead, with all peripherals off. It is important to maintain a stable power supply during the entire flash programming process. It is conceivable that device current consumption during flash programming could be higher than normal operating conditions. The power supply used should ensure VMIN on the supply rails at all times, as specified in the Recommended Operating Conditions of the data sheet. Any brown-out or interruption to power during erasing/programming could potentially corrupt the password locations and lock the device permanently. Powering a target board (during flash programming) through the USB port is not recommended, as the port may be unable to respond to the power demands placed during the programming process.
(5) This current is measured with Flash API executing from RAM. There is not any data transfer through JTAG or any peripheral.