SLLS897F march 2008 – august 2023 ISO1176
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
ISO1176 | ||||||
tPHL, tPLH | Propagation delay | VCC1 at 5 V, VCC2 at 5 V | 35 | ns | ||
tsk(p) | Pulse skew (|tPHL – tPLH|) |
2 | 7.5 | ns | ||
tPHL, tPLH | Propagation delay | VCC1 at 3.3 V, VCC2 at 5 V | 40 | ns | ||
tsk(p) | Pulse skew (|tPHL – tPLH|) |
2 | 7.5 | ns | ||
tr, tf | Differential output rise time and fall time | See Figure 17 | 2 | 3 | 7.5 | ns |
tpDE | DE to ISODE prop delay | See Figure 21 | 30 | ns | ||
tt(MLH), tt(MHL) | Output transition skew | See Figure 18 | 1 | ns | ||
tP(AZH), tP(BZH), tP(AZL), tP(BZL) | Propagation delay, high-impedance-to-active output |
CL = 50 pF, RE at 0 V, See Fgure 19 and Figure 20 | 80 | ns | ||
tP(AHZ), tP(BHZ), tP(ALZ), tP(BLZ) | Propagation delay time, active-to-high-impedance output | 80 | ns | |||
|tP(AZL) – tP(BZH)|, |tP(AZH) – tP(BZL)| | Enable skew time |
0.55 | 1.5 | ns | ||
t(CFB) |
Time from application of short-circuit to current foldback |
See Figure 16 | 0.5 | µs | ||
t(TSD) |
Time from application of short-circuit to thermal shutdown |
TA = 25°C, See Figure 16 |
100 | µs |