SLLSFN5A
June 2023 – February 2024
ISO1228
PRODUCTION DATA
1
1
Features
2
Applications
3
Description
4
Pin Configuration and Functions
5
Specifications
5.1
Absolute Maximum Ratings
5.2
ESD Ratings
5.3
Recommended Operating Conditions
5.4
Thermal Information
5.5
Power Ratings
5.6
Insulation Specifications
5.7
Safety-Related Certifications
5.8
Safety Limiting Values
5.9
Electrical Characteristics—DC Specification
5.10
Switching Characteristics—AC Specification
5.11
Typical Characteristics
6
Parameter Measurement Information
6.1
Test Circuits
7
Detailed Description
7.1
Overview
7.2
Functional Block Diagram
7.3
Feature Description
7.3.1
Surge Protection
7.3.2
Field Side LED Indication
7.3.3
Serial and Parallel Output option
7.3.4
Cyclic Redundancy Check (CRC)
7.3.5
FAULT Indication
7.3.6
Digital Low Pass Filter
7.3.7
SPI Register Map
7.3.8
SPI Interface Timing - Non-Daisy Chain
7.3.9
SPI Interface Timing - Daisy Chain
7.3.10
SPI Interface Timing - Burst Mode
7.4
Device Functional Modes
8
Application and Implementation
8.1
Application Information
8.2
Typical Application
8.2.1
Sinking Type Digital Inputs
8.2.2
Sourcing Type Digital Inputs
8.2.3
Design Requirements
8.2.3.1
Detailed Design Procedure
8.2.3.1.1
Current Limit
8.2.3.1.2
Voltage Thresholds
8.2.3.1.3
Wire-Break Detection
9
Power Supply Recommendations
10
Layout
10.1
Layout Guidelines
10.2
Layout Example
11
Device and Documentation Support
11.1
Documentation Support
11.1.1
Related Documentation
11.2
Receiving Notification of Documentation Updates
11.3
Support Resources
11.4
Trademarks
11.5
Electrostatic Discharge Caution
11.6
Glossary
12
Revision History
13
Mechanical, Packaging, and Orderable Information
13.1
Tape and Reel Information
Package Options
Mechanical Data (Package|Pins)
DFB|38
MPSS151A
Thermal pad, mechanical data (Package|Pins)
Orderable Information
sllsfn5a_oa
sllsfn5a_pm
6.1
Test Circuits
Figure 6-1
Switching Characteristics Test Circuit and Voltage Waveforms
Figure 6-2
Input Current and Voltage Threshold Test Circuit
Figure 6-3
Enable and Disable Propagation Delay Time Test Circuit and Waveform—Logic Low State
Figure 6-4
Enable and Disable Propagation Delay Time Test Circuit and Waveform—Logic High State
A.
Pass Criterion: The output must remain stable.
Figure 6-5
Common-Mode Transient Immunity Test Circuit