SLLSEM3I November 2014 – November 2024 ISO7841
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
PARAMETER | TEST CONDITIONS | SPECIFICATION | UNIT | ||
---|---|---|---|---|---|
DW | DWW | ||||
GENERAL | |||||
CLR | External clearance(1) | Shortest pin-to-pin distance through air | >8 | >14.5 | mm |
Shortest pin-to-pin distance through air (typical) | 15.0 | mm | |||
CPG | External creepage(1) | Shortest pin-to-pin distance across the package surface | >8 | >14.5 | mm |
Shortest pin-to-pin distance across the package surface (typical) | 15.0 | mm | |||
DTI | Distance through the insulation | Minimum internal gap (internal clearance) | >21 | >21 | μm |
CTI | Comparative tracking index | DIN EN 60112 (VDE 0303-11); IEC 60112; UL 746A | >600 | >600 | V |
Material group | I | I | |||
Overvoltage category per IEC 60664-1 | Rated mains voltage ≤ 600VRMS | I–IV | I–IV | ||
Rated mains voltage ≤ 1000VRMS | I–III | I–IV | |||
DIN EN IEC 60747-17 (VDE 0884-17)(2) | |||||
VIORM | Maximum repetitive peak isolation voltage | 2121 | 2828 | VPK | |
VIOWM | Maximum isolation working voltage | AC voltage (sine wave); Time dependent dielectric breakdown (TDDB) Test, see Figure 5-1 and Figure 5-2 | 1500 | 2000 | VRMS |
DC voltage | 2121 | 2828 | VDC | ||
VIOTM | Maximum transient isolation voltage | VTEST = 1.2 × VIOTM t = 60s (qualification) t= 1s (100% production) | 8000 | 8000 | VPK |
VIMP | Maximum impulse voltage (3) | Tested in air, 1.2/50μs waveform per IEC 62368-1 | 9800 | 9800 | VPK |
VIOSM | Maximum surge isolation voltage (4) | VIOSM ≥ 1.3 x VIMP; Tested in oil (qualification test), 1.2/50-μs waveform per IEC 62368-1 | 12800 | 12800 | VPK |
qpd | Apparent charge (5) | Method a: After I/O safety
test subgroup 2/3, Vini = VIOTM, tini = 60s; Vpd(m) = 1.2 × VIOTM = 2545VPK (DW) and 3394VPK (DWW), tm = 10s | ≤5 | ≤5 | pC |
Method a: After environmental
tests subgroup 1, Vini = VIOTM, tini = 60s; Vpd(m) = 1.6 × VIORM = 3394VPK (DW) and 4525VPK (DWW), tm = 10s | ≤5 | ≤5 | |||
Method b: At routine test (100% production); Vini = 1.2 x VIOTM, tini = 1s; Vpd(m) = 1.875 x VIORM, tm = 1s (method b1) or Vpd(m) = Vini, tm = tini (method b2) | ≤5 | ≤5 | |||
CIO | Barrier capacitance, input to output(6) | VIO = 0.4 × sin (2πft), f = 1MHz | 2 | 2 | pF |
RIO | Isolation resistance, input to output (6) | VIO = 500V, TA = 25°C | >1012 | >1012 | Ω |
VIO = 500V, 100°C ≤ TA ≤ 125°C | >1011 | >1011 | |||
VIO = 500V at TS = 150°C | >109 | >109 | |||
Pollution degree | 2 | 2 | |||
Climatic category | 55/125/21 | 55/125/21 | |||
UL 1577 | |||||
VISO | Withstand isolation voltage | VTEST = VISO = 5700VRMS, t = 60s (qualification), VTEST = 1.2 × VISO = 6840VRMS, t = 1s (100% production) | 5700 | 5700 | VRMS |