SWRS237B April   2020  – July 2022 IWR6843AOP

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Functional Block Diagram
  5. 5 Revision History
  6. 6 Device Comparison
    1. 6.1 Related Products
  7. 7 Terminal Configuration and Functions
    1. 7.1 Pin Diagram
    2. 7.2 Signal Descriptions
      1. 7.2.1 Pin Functions - Digital and Analog [ALP Package]
    3. 7.3 Pin Attributes
  8. 8 Specifications
    1. 8.1  Absolute Maximum Ratings
    2. 8.2  ESD Ratings
    3. 8.3  Power-On Hours (POH)
    4. 8.4  Recommended Operating Conditions
    5. 8.5  Power Supply Specifications
    6. 8.6  Power Consumption Summary
    7. 8.7  RF Specification
    8. 8.8  CPU Specifications
    9. 8.9  Thermal Resistance Characteristics for FCBGA Package [ALP0180A]
    10. 8.10 Timing and Switching Characteristics
      1. 8.10.1  Antenna Radiation Patterns
        1. 8.10.1.1 Antenna Radiation Patterns for Receiver
        2. 8.10.1.2 Antenna Radiation Patterns for Transmitter
      2. 8.10.2  Antenna Positions
      3. 8.10.3  Power Supply Sequencing and Reset Timing
      4. 8.10.4  Input Clocks and Oscillators
        1. 8.10.4.1 Clock Specifications
      5. 8.10.5  Multibuffered / Standard Serial Peripheral Interface (MibSPI)
        1. 8.10.5.1 Peripheral Description
        2. 8.10.5.2 MibSPI Transmit and Receive RAM Organization
          1. 8.10.5.2.1 SPI Timing Conditions
          2. 8.10.5.2.2 SPI Controller Mode Switching Parameters (CLOCK PHASE = 0, SPICLK = output, SPISIMO = output, and SPISOMI = input) (1) (1) (1)
          3. 8.10.5.2.3 SPI Controller Mode Switching Parameters (CLOCK PHASE = 1, SPICLK = output, SPISIMO = output, and SPISOMI = input) (1) (1) (1)
        3. 8.10.5.3 SPI Peripheral Mode I/O Timings
          1. 8.10.5.3.1 SPI Peripheral Mode Switching Parameters (SPICLK = input, SPISIMO = input, and SPISOMI = output) (1) (1) (1)
        4. 8.10.5.4 Typical Interface Protocol Diagram (Peripheral Mode)
      6. 8.10.6  LVDS Interface Configuration
        1. 8.10.6.1 LVDS Interface Timings
      7. 8.10.7  General-Purpose Input/Output
        1. 8.10.7.1 Switching Characteristics for Output Timing versus Load Capacitance (CL)
      8. 8.10.8  Controller Area Network - Flexible Data-rate (CAN-FD)
        1. 8.10.8.1 Dynamic Characteristics for the CANx TX and RX Pins
      9. 8.10.9  Serial Communication Interface (SCI)
        1. 8.10.9.1 SCI Timing Requirements
      10. 8.10.10 Inter-Integrated Circuit Interface (I2C)
        1. 8.10.10.1 I2C Timing Requirements (1)
      11. 8.10.11 Quad Serial Peripheral Interface (QSPI)
        1. 8.10.11.1 QSPI Timing Conditions
        2. 8.10.11.2 Timing Requirements for QSPI Input (Read) Timings (1) (1)
        3. 8.10.11.3 QSPI Switching Characteristics
      12. 8.10.12 ETM Trace Interface
        1. 8.10.12.1 ETMTRACE Timing Conditions
        2. 8.10.12.2 ETM TRACE Switching Characteristics
      13. 8.10.13 Data Modification Module (DMM)
        1. 8.10.13.1 DMM Timing Requirements
      14. 8.10.14 JTAG Interface
        1. 8.10.14.1 JTAG Timing Conditions
        2. 8.10.14.2 Timing Requirements for IEEE 1149.1 JTAG
        3. 8.10.14.3 Switching Characteristics Over Recommended Operating Conditions for IEEE 1149.1 JTAG
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Subsystems
      1. 9.3.1 RF and Analog Subsystem
        1. 9.3.1.1 Clock Subsystem
        2. 9.3.1.2 Transmit Subsystem
        3. 9.3.1.3 Receive Subsystem
      2. 9.3.2 Processor Subsystem
      3. 9.3.3 Host Interface
      4. 9.3.4 Main Subsystem Cortex-R4F
      5. 9.3.5 DSP Subsystem
      6. 9.3.6 Hardware Accelerator
    4. 9.4 Other Subsystems
      1. 9.4.1 ADC Channels (Service) for User Application
        1. 9.4.1.1 GP-ADC Parameter
  10. 10Monitoring and Diagnostics
    1. 10.1 Monitoring and Diagnostic Mechanisms
      1. 10.1.1 Error Signaling Module
  11. 11Applications, Implementation, and Layout
    1. 11.1 Application Information
    2. 11.2 Reference Schematic
  12. 12Device and Documentation Support
    1. 12.1 Device Nomenclature
    2. 12.2 Tools and Software
    3. 12.3 Documentation Support
    4. 12.4 Support Resources
    5. 12.5 Trademarks
    6. 12.6 Electrostatic Discharge Caution
    7. 12.7 Glossary
  13. 13Mechanical, Packaging, and Orderable Information
    1. 13.1 Packaging Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • ALP|180
Thermal pad, mechanical data (Package|Pins)
Orderable Information

12.1 Device Nomenclature

To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all microprocessors (MPUs) and support tools. Each device has one of three prefixes: X, P, or null (no prefix) (for example, IWR6843AOP). Texas Instruments recommends two of three possible prefix designators for its support tools: TMDX and TMDS. These prefixes represent evolutionary stages of product development from engineering prototypes (TMDX) through fully qualified production devices and tools (TMDS).

Device development evolutionary flow:

    XExperimental device that is not necessarily representative of the final device's electrical specifications and may not use production assembly flow.
    PPrototype device that is not necessarily the final silicon die and may not necessarily meet final electrical specifications.
    nullProduction version of the silicon die that is fully qualified.

Support tool development evolutionary flow:

    TMDXDevelopment-support product that has not yet completed Texas Instruments internal qualification testing.
    TMDSFully-qualified development-support product.

X and P devices and TMDX development-support tools are shipped against the following disclaimer:

"Developmental product is intended for internal evaluation purposes."

Production devices and TMDS development-support tools have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies.

Predictions show that prototype devices (X or P) have a greater failure rate than the standard production devices. Texas Instruments recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used.

TI device nomenclature also includes a suffix with the device family name. This suffix indicates the package type (for example, ), the temperature range (for example, blank is the default commercial temperature range). Figure 12-1 provides a legend for reading the complete device name for any IWR6843AOP device.

For orderable part numbers of IWR6843AOP devices in the ALP0180A package types, see the Package Option Addendum of this document (when available), the TI website (www.ti.com), or contact your TI sales representative.

For additional description of the device nomenclature markings on the die, see the device Silicon Errata.

GUID-BCFC89F6-1F38-4AC3-9034-AF489DB40B0E-low.gifFigure 12-1 Device Nomenclature