SNOSDI7 December 2023 LDC5071-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tVREG_OV_DT | Deglitch time for VREG over voltage detection | 180 | 200 | 220 | µs | |
tAGC_EN_DT | Deglitch time for AGC_EN pin for AGC mode detection | 2.7 | 3 | 3.3 | µs | |
tAGC_EN_TGL_DT | Deglitch time on AGC_EN pin toggle fault after power up into normal state | 450 | 500 | 550 | µs | |
tAGC_CMP_DT | Deglitch time to detect AGC fast/slow amplitude regulation threshold has been crossed | 180 | 200 | 220 | ns | |
tAGC_VAL_DT | Deglitch time for AGC OOR range faults | 180 | 200 | 220 | µs | |
tFLT_RECOV | Fault recovery time once device tranistions from FAULT to DIAGNOSTIC state | CEXT_VREG=680nF, 2.2µF | 12 | 16 | ms | |
tPWR_ON | From VREG power on until OUTx pins are released from HI-Z state. | CEXT_VREG=680nF, 2.2µF | 10 | 14 | ms |