SNVSC12 April   2021 LM117QML-SP

PRODUCTION DATA  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Device Comparison Table
  6. Pin Configurations and Functions
  7. Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics: 0.5–A IOUT Devices (LM117H, LM117GW)
    6. 7.6  Parameter Drift: 0.5–A IOUT Devices (LM117H, LM117GW)
    7. 7.7  Electrical Characteristics: 1.5–A IOUT Devices (LM117K)
    8. 7.8  Parameter Drift: 1.5–A IOUT Devices (LM117K)
    9. 7.9  Quality Conformance Inspection
    10. 7.10 Typical Characteristics
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Setting Output Voltage
    4. 8.4 External Capacitors
    5. 8.5 Load Regulation
    6. 8.6 Protection Diodes
  9. Application and Implementation
    1. 9.1 Typical Applications
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Third-Party Products Disclaimer
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 Receiving Notification of Documentation Updates
    4. 12.4 Support Resources
    5. 12.5 Trademarks
    6. 12.6 Electrostatic Discharge Caution
    7. 12.7 Glossary

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • K|2
  • NAC|16
  • Y|0
  • NDT|3
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Electrical Characteristics: 0.5–A IOUT Devices (LM117H, LM117GW)

Over operating temperature range (T = –55°C to 125°C) unless otherwise noted.
PARAMETER TEST CONDITIONS(1) SUBGROUP(2) MIN MAX UNIT
VO Output voltage VI = 4.25 V, IL = –5 mA 1, 2, 3 1.2 1.3 V
25°C

Post-radiation

1 1.35
VI = 4.25 V, IL = –500 mA 1, 2, 3 1.2 1.3
25°C

Post-radiation

1 1.35
VI = 41.25 V, IL = –5 mA 1, 2, 3 1.2 1.3
25°C

Post-radiation

1 1.35
VI = 41.25V, IL = –50mA 1, 2, 3 1.2 1.3
25°C

Post-radiation

1 1.35
VI = 6.25 V, IL = –5 mA 125°C 2 1.2 1.3
VRLine Line regulation 4.25 V ≤ VI ≤ 41.25 V,
IL = –5 mA
25°C 1 –9 9 mV
125°C, –55°C 2, 3 –23 23
25°C

Post-radiation

1 –25 25
VRLoad Load regulation VI = 6.25 V,
–500 mA ≤ IL ≤ –5 mA
1, 2, 3 –12 12 mV
VI = 41.25 V,
–50 mA ≤ IL ≤ –5 mA
1, 2, 3 –12 12
VRTh Thermal regulation VI = 14.6 V, IL = –500 mA 25°C 1 –12 12 mV
IAdj Adjust pin current VI = 4.25 V, IL = –5 mA 1, 2, 3 –100 –15 µA
VI = 41.25 V, IL = –5 mA 1, 2, 3 –100 –15
ΔIAdj/ Line Adjust pin current change 4.25 V ≤ VI ≤ 41.25 V,
IL = –5 mA
1, 2, 3 –5 5 µA
ΔIAdj / Load Adjust pin current change VI = 6.25 V,
–500 mA ≤ IL ≤ –5 mA
1, 2, 3 –5 5 µA
IQ Minimum load current VI = 4.25 V,
Forced VO = 1.4 V
1, 2, 3 –3 –0.5 mA
VI = 14.25 V,
Forced VO = 1.4 V
1, 2, 3 –3 –0.5
VI = 41.25 V,
Forced VO = 1.4 V
1, 2, 3 –5 –1
IOS Output short circuit current VI = 4.25 V 1, 2, 3 –1.8 –0.5 A
VI = 40 V 1, 2, 3 –0.5 –0.05
VO (Recov) Output voltage recovery VI = 4.25 V, RL = 2.5 Ω,
CL = 20 µF
1, 2, 3 1.2 1.3 V
25°C

Post-radiation

1

1.35

VI = 40 V, RL = 250 Ω 1, 2, 3 1.2 1.3
25°C

Post-radiation

1

1.35

VStart Voltage start-up VI = 4.25 V, RL = 2.5 Ω,
CL = 20 µF, IL = –500 mA
1, 2, 3 1.2 1.3 V
VNO Output noise voltage VI = 6.25 V, IL = –50 mA 25°C 7 120 µVRMS
ΔVO / ΔVI Line transient response VI = 6.25 V, ΔVI = 3 V,
IL = –10 mA
25°C 7

6

mV/V
ΔVO / ΔIL Load transient response VI = 6.25V, ΔIL = –200 mA,
IL = –50 mA
25°C 7 0.6 mV/mA
ΔVI / ΔVO Ripple rejection VI = 6.25 V, IL = –125 mA,
EI = 1 VRMS at ƒ = 2400 Hz

25°C

4 65 dB
25°C

Post-radiation

4 60
Pre- and post-irradiation limits are identical for the parameters above unless specified by the test conditions.
For subgroup definitions, see Quality Conformance Inspection table.