The total driver IC power dissipation can be estimated through the following components.
- Static power losses, PQC, due to
quiescent currents IGVDD and IBST is shown in Equation 12.
Equation 12. PQC = VGVDD × IGVDD +
(VGVDD – VF) × IBST = 12V × 0.43mA
+ (12V – 1V) × 0.15mA = 6.8mW
- Level-shifter losses, PIBSTS, due
high-side leakage current IBSTS is shown in Equation 13.
Equation 13. PIBSTS =
VBST × IBSTS × D = 72V × 0.033mA × 0.95 =
2.26mW
where
- D is the high-side switch
duty cycle
- Dynamic losses, PQG1&2, due to the
FETs gate charge QG as shown in Equation 14.
Equation 14.
where
- QG = Total
FETs gate charge
- fSW =
Switching frequency
- RGD_R =
Average value of pullup and pulldown resistor
- RGATE =
External gate drive resistor
- RGFET_INT =
Internal FETs gate resistor
- Level-shifter dynamic losses, PLS,
during high-side switching due to required level-shifter charge on each
switching cycle. For this example it is assumed that value of parasitic charge
QP is 2.5 nC, as shown in Equation 15.
Equation 15. PLS = VBST × QP × fSW = 72V
× 2.5nC × 50kHz = 9mW
In this example, the sum of all the losses is 27
mW as a total gate driver loss. For gate drivers that include bootstrap diode, one
should also estimate losses in the bootstrap diode. Diode forward conduction loss is
computed as product of average forward voltage drop and average forward current.
Equation 16
estimates the maximum allowable power loss of the device for a given ambient
temperature.
Equation 16.
where
- PMAX = Maximum allowed power
dissipation in the gate driver device
- TJ = Junction temperature
- TA = Ambient temperature
- RθJA = Junction-to-ambient thermal resistance
The thermal metrics for the driver package is
summarized in the Thermal Information table of the data sheet. For detailed
information regarding the thermal information table, refer to the Texas Instruments
application note entitled Semiconductor and IC Package Thermal Metrics.