SNAS555D
June 2000 – December 2016
LM2907-N
,
LM2917-N
PRODUCTION DATA.
1
Features
2
Applications
3
Description
4
Revision History
5
Description (continued)
6
Pin Configuration and Functions
7
Specifications
7.1
Absolute Maximum Ratings
7.2
ESD Ratings
7.3
Recommended Operating Conditions
7.4
Thermal Information
7.5
Electrical Characteristics
7.6
Typical Characteristics
8
Parameter Measurement Information
9
Detailed Description
9.1
Overview
9.2
Functional Block Diagram
9.3
Feature Description
9.3.1
Differential Input
9.3.2
Configurable
9.3.3
Output Stage
9.4
Device Functional Modes
9.4.1
Grounded Input Devices (8-Pin LM2907 and LM2917)
9.4.2
Differential Input Devices (LM2907 and LM2917)
10
Application and Implementation
10.1
Application Information
10.2
Typical Applications
10.2.1
Minimum Component Tachometer
10.2.1.1
Design Requirements
10.2.1.2
Detailed Design Procedure
10.2.1.2.1
Choosing R1 and C1
10.2.1.2.2
Using Zener Regulated Options (LM2917)
10.2.1.3
Application Curves
10.2.2
Other Application Circuits
10.2.2.1
Variable Reluctance Magnetic Pickup Buffer Circuits
10.2.2.2
Finger Touch or Contact Switch
10.2.2.3
Over-Speed Latch
10.2.2.4
Frequency Switch Applications
10.2.2.4.1
Application Curves
10.2.2.5
Anti-Skid Circuits
10.2.2.5.1
Select-Low Circuit
10.2.2.5.2
Select-High Circuit
10.2.2.5.3
Select-Average Circuit
10.2.2.6
Changing the Output Voltage for an Input Frequency of Zero
10.2.2.7
Changing Tachometer Gain Curve or Clamping the Minimum Output Voltage
11
Power Supply Recommendations
12
Layout
12.1
Layout Guidelines
12.2
Layout Example
13
Device and Documentation Support
13.1
Related Links
13.2
Receiving Notification of Documentation Updates
13.3
Community Resources
13.4
Trademarks
13.5
Electrostatic Discharge Caution
13.6
Glossary
14
Mechanical, Packaging, and Orderable Information
Package Options
Mechanical Data (Package|Pins)
D|8
MSOI002K
N|14
MPDI002C
D|14
MPDS177H
P|8
MPDI001B
Thermal pad, mechanical data (Package|Pins)
Orderable Information
snas555d_oa
snas555d_pm
8
Parameter Measurement Information
Figure 13.
Test Circuit
Figure 14.
Tachometer Input Threshold Measurement