6.1 Absolute Maximum Ratings
See (1)(2)
|
MIN |
MAX |
UNIT |
VDD to VSS |
–0.3 |
18 |
V |
HB to HS |
−0.3 |
18 |
V |
LI or HI to VSS |
−0.3 |
VDD + 0.3 |
V |
LO to VSS |
−0.3 |
VDD + 0.3 |
V |
HO to VSS |
VHS − 0.3 |
VHB + 0.3 |
V |
HS to VSS(3) |
−5 |
90 |
V |
HB to VSS |
|
108 |
V |
Junction Temperature |
–40 |
150 |
°C |
Storage Temperature Range |
−55 |
150 |
°C |
(1) Absolute Maximum Ratings indicate limits beyond which damage to the component may occur. Operating Ratings are conditions under which operation of the device is specified. Operating Ratings do not imply performance limits. For performance limits and associated test conditions, see the
Electrical Characteristics.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and specifications.
(3) In the application the HS node is clamped by the body diode of the external lower N-MOSFET, therefore the HS voltage will generally not exceed –1V. However in some applications, board resistance and inductance may result in the HS node exceeding this stated voltage transiently. If negative transients occur on HS, the HS voltage must never be more negative than VDD – 15V. For example, if VDD = 10V, the negative transients at HS must not exceed –5V.
6.3 Recommended Operating Conditions
|
MIN |
NOM |
MAX |
UNIT |
VDD |
8 |
|
14 |
V |
HS(1) |
−1 |
|
90 |
V |
HB |
VHS + 8 |
|
VHS + 14 |
V |
HS Slew Rate |
|
|
< 50 |
V/ns |
Junction Temperature |
−40 |
|
125 |
°C |
(1) In the application the HS node is clamped by the body diode of the external lower N-MOSFET, therefore the HS voltage will generally not exceed –1V. However in some applications, board resistance and inductance may result in the HS node exceeding this stated voltage transiently. If negative transients occur on HS, the HS voltage must never be more negative than VDD – 15V. For example, if VDD = 10V, the negative transients at HS must not exceed –5V.