6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
|
MIN |
MAX |
UNIT |
Supply voltage |
12 |
–0.2 |
V |
Output voltage |
(+VS + 0.6) |
–0.6 |
V |
Output current |
|
10 |
mA |
Input current at any pin(2) |
|
5 |
mA |
Maximum junction temperature, TJ |
|
125 |
°C |
Storage temperature, Tstg |
–65 |
150 |
°C |
(1) Stresses beyond those listed under
Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) When the input voltage (VI) at any pin exceeds power supplies (VI < GND or VI > VS), the current at that pin must be limited to 5 mA.
6.2 ESD Ratings
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)(2) |
±2500 |
V |
Machine Model (MM)(3) |
±250 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) The human body model is a 100-pF capacitor discharged through a 1.5-kΩ resistor into each pin.
(3) The machine model is a 200-pF capacitor discharged directly into each pin.
6.5 Electrical Characteristics
+VS = 3 V (DC)(1)(2)
PARAMETER |
TEST CONDITIONS |
MIN(3) |
TYP(4) |
MAX(3) |
UNIT |
Accuracy(5) |
TA = 25°C |
LM61B |
–2 |
|
2 |
°C |
LM61C |
–3 |
|
3 |
LM61B |
–3 |
|
3 |
LM61C |
–4 |
|
4 |
Output voltage at 0°C |
|
|
600 |
|
mV |
Nonlinearity(6) |
LM61B |
–0.6 |
|
0.6 |
°C |
LM61C |
–0.8 |
|
0.8 |
Sensor gain (average slope) |
LM61B |
9.7 |
10 |
10.3 |
mV/°C |
LM61C |
9.6 |
10 |
10.4 |
Output impedance |
+VS = 3 V to 10 V |
|
|
0.8 |
kΩ |
TA = –30°C to 85°C, +VS = 2.7 V |
|
|
2.3 |
TA = 85°C to 100°C, +VS = 2.7 V |
|
|
5 |
Line regulation(7) |
+VS = 3 V to 10 V |
–0.7 |
|
0.7 |
mV/V |
+VS = 2.7 V to 3.3 V |
–5.7 |
|
5.7 |
mV |
Quiescent current |
+VS = 2.7 V to 10 V |
TA = 25°C |
|
82 |
125 |
µA |
|
|
|
155 |
Change of quiescent current |
+VS = 2.7 V to 10 V |
|
±5 |
|
µA |
Temperature coefficient of quiescent current |
|
|
0.2 |
|
µA/°C |
Long term stability(8) |
TJ = TMAX = 100°C, for 1000 hours |
|
±0.2 |
|
°C |
(1) Limits are specified to TI's AOQL (Average Outgoing Quality Level).
(2) Typical limits represent most likely parametric norm.
(3) Maximum and minimum limits apply for TA = TJ = TMIN to TMAX.
(4) Typical limits apply for TA = TJ = 25°C.
(5) Accuracy is defined as the error between the output voltage and 10 mV/°C multiplied by the device's case temperature plus 600 mV, at specified conditions of voltage, current, and temperature (expressed in °C).
(6) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's rated temperature range.
(7) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(8) For best long-term stability, any precision circuit gives best results if the unit is aged at a warm temperature, or temperature cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur. The majority of the drift occurs in the first 1000 hours at elevated temperatures. The drift after 1000 hours does not continue at the first 1000-hour rate.