SNOSDE8A July 2023 – September 2023 LM74912-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tDGATE_OFF(dly) | DGATE turn off delay during reverse voltage detection | V(A) – V(C) = +30 mV to –100 mV to V(DGATE–A) < 1 V, C(DGATE–A) = 10 nF | 0.5 | 0.95 | µs | |
tDGATE_ON(dly) | DGATE turn on delay during forward voltage detection | V(A) – V(C) = –20 mV to +700 mV to V(DGATE–A) > 5 V, C(DGATE–A) = 10 nF | 0.8 | 1.6 | µs | |
tEN(dly)_DGATE | DGATE turn on delay during device enable | EN↑ to V(DGATE–A) > 5 V | 185 | 270 | µs | |
tUVLO_OFF(deg)_HGATE | HGATE turn off de-glitch during UVLO | UVLO↓ to HGATE ↓ | 5 | 7 | µs | |
tUVLO_ON(deg)_HGATE | HGATE turn on de-glitch during UVLO | UVLO ↑ to HGATE ↑ | 7 | µs | ||
tOVP_OFF(deg)_HGATE | HGATE turn off de-glitch during OV | OV ↑ to HGATE ↓, C(HGATE–OUT) = 4.7 nF | 4 | 7 | µs | |
tOVP_ON(deg)_HGATE | HGATE turn on de-glitch during OV | OV ↓ to HGATE ↑ | 7 | µs | ||
tSCP_DLY | Short-circuit protection turn off delay | (VCS+–VISCP) = 0-mV to 100-mV, HGATE↓, C(HGATE–OUT) = 10 nF |
2 | 4.5 | µs | |
tFLT_ASSERT | Fault assert delay during short-circuit condition | (VCS+–VISCP)↑ to FLT↓ |
2.5 | µs | ||
tFLT_DE-ASSERT | Fault de-assert delay | (VCS+–VISCP) ↓ to FLT↑ | 3.5 | µs | ||
tSLEEP_OCP_LATCH | SLEEP OCP Latch delay | SLEEP = Low, EN = High | 3.5 | 7.5 | µs | |
tSLEEP_OV_OFF | Overvoltage turn off response delay in sleep mode | SLEEP = Low, EN = High | 3.5 | µs | ||
tSLEEP_MODE_ENTRY | Sleep Mode Entry Delay | SLEEP = Low, EN = High | 100 | µs |