SNAS254B October   2006  – April 2017 LM98714

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 AC Timing Specifications
    7. 6.7 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Input Clock Introduction
      2. 7.3.2  Modes of Operation
        1. 7.3.2.1 Mode 3 - Three Channel Input/Synchronous Pixel Sampling
        2. 7.3.2.2 Mode 2 - Two Channel Input/Synchronous Pixel Sampling
        3. 7.3.2.3 Mode 1a - One Channel Input/One, Two, Three, Four, or Five Color Sequential Line Sampling
        4. 7.3.2.4 Mode 1b - One Channel Input Per Line/Sequential Line (Input) Sampling/Three Channel Processing
      3. 7.3.3  Input Bias and Clamping
        1. 7.3.3.1 CDS Mode
        2. 7.3.3.2 Input Source Follower Buffers
        3. 7.3.3.3 VCLP DAC
      4. 7.3.4  Coarse Pixel Phase Alignment
      5. 7.3.5  Internal Sample Timing
      6. 7.3.6  Automatic Black Level Correction Loop
        1. 7.3.6.1 Black Level Offset DAC
        2. 7.3.6.2 Black Level Clamp (BLKCLP)
        3. 7.3.6.3 Pixel Averaging
        4. 7.3.6.4 Target Black Level
        5. 7.3.6.5 Offset Integration
        6. 7.3.6.6 Line Averaging
      7. 7.3.7  Internal Timing Generation
        1. 7.3.7.1 Pix Signal Generator OR/NOR Modes
        2. 7.3.7.2 SH2 and SH3 Generation
      8. 7.3.8  CCD Timing Generator Master/Slave Modes
        1. 7.3.8.1 Master Timing Generator Mode
        2. 7.3.8.2 Slave Timing Generator Mode
      9. 7.3.9  LVDS Output Mode
        1. 7.3.9.1 LVDS Output Format
        2. 7.3.9.2 LVDS Output Timing Details
        3. 7.3.9.3 LVDS Control Bit Coding
        4. 7.3.9.4 LVDS Data Latency Diagrams
        5. 7.3.9.5 LVDS Test Modes
          1. 7.3.9.5.1 Test Mode 1 - Worst Case Transitions
          2. 7.3.9.5.2 Test Mode 2 - Ramp
          3. 7.3.9.5.3 Test Mode 3 - Fixed Output Data
      10. 7.3.10 CMOS Output Mode
        1. 7.3.10.1 CMOS Output Data Format
      11. 7.3.11 CMOS Output Data Latency Diagrams
    4. 7.4 Device Functional Modes
      1. 7.4.1 Mode 3 - Three Channel Input/Synchronous Pixel Sampling
      2. 7.4.2 Mode 2 - Two Channel Input/Synchronous Pixel Sampling
      3. 7.4.3 Mode 1a - One Channel Input/One, Two, Three, Four, Or Five Color Sequential Line Sampling
      4. 7.4.4 Mode 1b - One Channel Color Input Per Line/Sequential Line (Input) Sampling/Three Channel Processing
    5. 7.5 Programming
      1. 7.5.1 Serial Interface
        1. 7.5.1.1 Writing To The Serial Registers
        2. 7.5.1.2 Reading The Serial Registers
        3. 7.5.1.3 Serial Interface Timing Details
    6. 7.6 Register Maps
      1. 7.6.1 Configuration Registers
      2. 7.6.2 Register Definition
  8. 8 Application and Implementation
    1. 8.1 Typical Application
  9. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Device Support
        1. 9.1.1.1 Development Support
      2. 9.1.2 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Community Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  10. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

9 Device and Documentation Support

9.1 Documentation Support

9.1.1 Device Support

9.1.1.1 Development Support

For development support see the LM98714 IBIS Model.

9.1.2 Related Documentation

For related documentation see the following:

AN-1538 Interfacing Texas Instruments DS90CR218A and LM98714

9.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.

9.3 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.

9.4 Trademarks

E2E is a trademark of Texas Instruments.

All other trademarks are the property of their respective owners.

9.5 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

9.6 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.