SNAS522K September   2011  – December 2023 LMK03806

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1 Differential Voltage Measurement Terminology
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagrams
    3. 7.3 Features Description
      1. 7.3.1 Serial MICROWIRE Timing Diagram and Terminology
      2. 7.3.2 Crystal Support With Buffered Outputs
      3. 7.3.3 Integrated Loop Filter Poles
      4. 7.3.4 Integrated VCO
      5. 7.3.5 Clock Distribution
        1. 7.3.5.1 CLKout DIvider
        2. 7.3.5.2 Programmable Output Type
        3. 7.3.5.3 Clock Output Synchronization
      6. 7.3.6 Default Start-Up Clocks
    4. 7.4 Device Functional Modes
    5. 7.5 Programming
      1. 7.5.1 General Information
        1. 7.5.1.1 Special Programming Case for R0 to R5 for CLKoutX_Y_DIV > 25
        2. 7.5.1.2 Recommended Initial Programming Sequence
        3. 7.5.1.3 READBACK
          1. 7.5.1.3.1 Readback Example
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Crystal Interface
      2. 8.1.2 Driving OSCin Pins With a Single-Ended Source
      3. 8.1.3 Driving OSCin Pins With a Differential Source
      4. 8.1.4 Frequency Planning With the LMK03806
      5. 8.1.5 Configuring the PLL
        1. 8.1.5.1 Example PLL Configuration
      6. 8.1.6 Digital Lock Detect
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Device Selection
          1. 8.2.2.1.1 Clock Architect
          2. 8.2.2.1.2 Clock Design Tool
          3. 8.2.2.1.3 Calculation Using LCM
        2. 8.2.2.2 Device Configuration
        3. 8.2.2.3 PLL Loop Filter Design
          1. 8.2.2.3.1 Example Loop Filter Design
        4. 8.2.2.4 Other Device Specific Configuration
          1. 8.2.2.4.1 Digital Lock Detect
        5. 8.2.2.5 Device Programming
      3. 8.2.3 Application Curves
    3. 8.3 System Examples
      1. 8.3.1 System Level Diagram
    4. 8.4 Best Design Practices
      1. 8.4.1 LVCMOS Complementary vs. Non-Complementary Operation
      2. 8.4.2 LVPECL Outputs
      3. 8.4.3 Sharing MICROWIRE (SPI) Lines
      4. 8.4.4 SYNC Pin
      5. 8.4.5 CLKout Vcc Pins
    5. 8.5 Power Supply Recommendations
      1. 8.5.1 Current Consumption and Power Dissipation Calculations
    6. 8.6 Layout
      1. 8.6.1 Layout Guidelines
      2. 8.6.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
      1. 9.1.1 Development Support
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Register Maps
    1. 10.1  Default Device Register Settings After Power On Reset
    2. 10.2  Register R0 TO R5
      1. 10.2.1 CLKoutX_Y_PD, Powerdown CLKoutX_Y Output Path
      2. 10.2.2 RESET
      3. 10.2.3 POWERDOWN
      4. 10.2.4 CLKoutX_Y_DIV, Clock Output Divide
    3. 10.3  Registers R6 TO R8
      1. 10.3.1 CLKoutX_TYPE
    4. 10.4  REGISTER R9
    5. 10.5  REGISTER R10
      1. 10.5.1 OSCout1_TYPE, LVPECL Output Amplitude Control
      2. 10.5.2 OSCout0_TYPE
      3. 10.5.3 EN_OSCoutX, OSCout Output Enable
      4. 10.5.4 OSCoutX_MUX, Clock Output Mux
      5. 10.5.5 OSCout_DIV, Oscillator Output Divide
    6. 10.6  REGISTER R11
      1. 10.6.1 NO_SYNC_CLKoutX_Y
      2. 10.6.2 SYNC_POL_INV
      3. 10.6.3 SYNC_TYPE
      4. 10.6.4 EN_PLL_XTAL
    7. 10.7  REGISTER R12
      1. 10.7.1 LD_MUX
      2. 10.7.2 LD_TYPE
      3. 10.7.3 SYNC_PLL_DLD
    8. 10.8  REGISTER R13
      1. 10.8.1 READBACK_TYPE
      2. 10.8.2 GPout0
    9. 10.9  REGISTER 14
      1. 10.9.1 GPout1
    10. 10.10 REGISTER 16
    11. 10.11 REGISTER 24
      1. 10.11.1 PLL_C4_LF, PLL Integrated Loop Filter Component
      2. 10.11.2 PLL_C3_LF, PLL Integrated Loop Filter Component
      3. 10.11.3 PLL_R4_LF, PLL Integrated Loop Filter Component
      4. 10.11.4 PLL_R3_LF, PLL Integrated Loop Filter Component
    12. 10.12 REGISTER 26
      1. 10.12.1 EN_PLL_REF_2X, PLL Reference Frequency Doubler
      2. 10.12.2 PLL_CP_GAIN, PLL Charge Pump Current
      3. 10.12.3 PLL_DLD_CNT
    13. 10.13 REGISTER 28
      1. 10.13.1 PLL_R, PLL R Divider
    14. 10.14 REGISTER 29
      1. 10.14.1 OSCin_FREQ, PLL Oscillator Input Frequency Register
      2. 10.14.2 PLL_N_CAL, PLL N Calibration Divider
    15. 10.15 REGISTER 30
      1. 10.15.1 PLL_P, PLL N Prescaler Divider
      2. 10.15.2 PLL_N, PLL N Divider
    16. 10.16 REGISTER 31
      1. 10.16.1 READBACK_ADDR
      2. 10.16.2 uWire_LOCK
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.1.2 Driving OSCin Pins With a Single-Ended Source

The LMK03806 has an the ability to be driven by an external reference. Typical external reference interfaces are shown in Figure 8-2 and Figure 8-3.

In applications where the external reference amplitude is less than the VOSCin specification of 2.4 Vpp Figure 8-2 is an appropriate method of interfacing the reference to the LMK03806.

In applications where the external reference amplitude is greater than the VOSCin specification of 2.4 Vpp Figure 8-3 is an appropriate method of interfacing the reference to the LMK03806.

In both cases C1 and C2 should be present a low impedance at the reference frequency. A typical value for C1 and C2 is 0.1 µF.

GUID-C17692C9-0884-491F-B392-CD3AC222DE75-low.gifFigure 8-2 LVCMOS External Reference Interface
GUID-CF89E575-8F2C-4F31-B0F5-E070F6E7F2DD-low.gifFigure 8-3 3.3 Vpp External Reference Interface

Using an external reference, such as a crystal oscillator (XO), may provide better phase noise than a crystal at offsets below the loop bandwidth. If the jitter integration bandwidth for the application of interest is above the loop filter bandwidth, the added phase noise of a crystal will not be a significant jitter contributor and may be a more cost effective solution than an XO. Also, operating at higher reference frequencies allows higher phase detector frequencies, which also improves in band PLL phase noise performance.