SNOSDB6C December   2020  – March 2022 LMP7704-SP

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: VS = 5 V
    6. 6.6 Electrical Characteristics: VS = 10 V
    7. 6.7 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Radiation Hardened Performance
      2. 7.3.2 Engineering Model (Devices With /EM Suffix)
      3. 7.3.3 Capacitive Load
      4. 7.3.4 Input Capacitance
      5. 7.3.5 Diodes Between the Inputs
    4. 7.4 Device Functional Modes
      1. 7.4.1 Precision Current Source
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Low Input Voltage Noise
      2. 8.1.2 Total Noise Contribution
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Receiving Notification of Documentation Updates
    2. 11.2 Support Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.1 Radiation Hardened Performance

Total Ionizing Dose (TID)—The LMP7704-SP is a radiation-hardness-assured (RHA) QML class V (QMLV) product, with a total ionizing dose (TID) level specified in the Device Information table on the front page of this data sheet. Testing and qualification of these products is done on a wafer level according to MIL-STD-883, Test Method 1019. Radiation lot acceptance testing (RLAT) is performed at 30-krad, 50-krad, and 100-krad TID levels.

Group E TID RLAT data are available with lot shipments as part of the QCI summary reports; for information on finding QCI summary reports, see QML Flow, Its Importance, and Obtaining Lot Information.

Neutron Displacement Damage (NDD)—The LMP7704-SP was irradiated up to 1 × 1012 n/cm2. A sample size of 15 units was exposed to radiation testing per MILSTD-883, Method 1017 for Neutron Irradiation.

Single-Event Effects (SEE)—One-time SEE characterization was performed according to EIA/JEDEC standard, EIA/JEDEC57 to linear energy transfer (LET) = 85 MeV⋅cm2/mg. During testing, no single-event latch-up (SEL) was observed.