SLLSFU1A December 2023 – July 2024 MCF8315C
PRODMIX
PARAMETER | TEST CONDITIONS | MIN | NOM | MAX | UNIT | |
---|---|---|---|---|---|---|
Standard-mode | ||||||
fSCL | SCL clock frequency | 0 | 100 | kHz | ||
tHD_STA | Hold time (repeated) START condition | After this period, the first clock pulse is generated | 4 | µs | ||
tLOW | LOW period of the SCL clock | 4.7 | µs | |||
tHIGH | HIGH period of the SCL clock | 4 | µs | |||
tSU_STA | Set-up time for a repeated START condition | 4.7 | µs | |||
tHD_DAT | Data hold time (2) | I2C bus devices | 0 (3) | (4) | µs | |
tSU_DAT | Data set-up time | 250 | ns | |||
tr | Rise time for both SDA and SCL signals | 1000 | ns | |||
tf | Fall time of both SDA and SCL signals (3)(6)(7)(8) | 300 | ns | |||
tSU_STO | Set-up time for STOP condition | 4 | µs | |||
tBUF | Bus free time between STOP and START condition | 4.7 | µs | |||
Cb | Capacitive load for each bus line (9) | 400 | pF | |||
tVD_DAT | Data valid time (10) | 3.45 (4) | µs | |||
tVD_ACK | Data valid acknowledge time (11) | 3.45 (4) | µs | |||
VnL | Noise margin at the LOW level | For each connected device (including hysteresis) | 0.1*AVDD | V | ||
Vnh | Noise margin at the HIGHlevel | For each connected device (including hysteresis) | 0.2*AVDD | V | ||
Fast-mode | ||||||
fSCL | SCL clock frequency | 0 | 400 | KHz | ||
tHD_STA | Hold time (repeated) START condition | After this period, the first clock pulse is generated | 0.6 | µs | ||
tLOW | LOW period of the SCL clock | 1.3 | µs | |||
tHIGH | HIGH period of the SCL clock | 0.6 | µs | |||
tSU_STA | Set-up time for a repeated START condition | 0.6 | µs | |||
tHD_DAT | Data hold time (2) | 0 (3) | (4) | µs | ||
tSU_DAT | Data set-up time | 100 (5) | ns | |||
tr | Rise time for both SDA and SCL signals | 20 | 300 | ns | ||
tf | Fall time of both SDA and SCL signals (3)(6)(7)(8) | 20 x (AVDD/5.5V) | 300 | ns | ||
tSU_STO | Set-up time for STOP condition | 0.6 | µs | |||
tBUF | Bus free time between STOP and START condition | 1.3 | µs | |||
Cb | Capacitive load for each bus line (9) | 400 | pF | |||
tVD_DAT | Data valid time (10) | 0.9 (4) | µs | |||
tVD_ACK | Data valid acknowledge time (11) | 0.9 (4) | µs | |||
VnL | Noise margin at the LOW level | For each connected device (including hysteresis) | 0.1*AVDD | V | ||
Vnh | Noise margin at the HIGHlevel | For each connected device (including hysteresis) | 0.2*AVDD | V |