If the die temperature exceeds the
trip point of the thermal shutdown limit (TOTSD), an OTSD event is
recognized. After detecting the OTSD overtemperature event, all of the gate driver
outputs are driven low to disable the external MOSFETs, and nFAULT pin is driven low.
The over temperature protection can be configured for a latched mode or automatic
recovery mode by configuring OTS_AUTO_RECOVERY. In latched mode, normal operation
resumes after the TOTSD condition is cleared and a clear fault command is
issued through the CLR_FLT bit. In automatic recovery mode, normal operation resumes
after the TOTSD condition is cleared.