SLLSFQ3 January 2023 MCT8329A
PRODUCTION DATA
The device has adjustable VDS voltage monitors to detect overcurrent or short-circuit conditions on the external power MOSFETs. A MOSFET overcurrent event is sensed by monitoring the VDS voltage drop across the external MOSFET RDS(on). The high-side VDS monitors measure between the PVDD and SHx pins and the low-side VDS monitors measure between the SHx and LSS pins. If the voltage across external MOSFET exceeds the threshold set by SEL_VDS_LVL for longer than the tDS_DG deglitch time, a VDS_OCP event is recognized. After detecting the VDS overcurrent event, all of the gate driver outputs are driven low to disable the external MOSFETs and nFAULT pin is driven low. VDS_OCP can be disabled by configuring DIS_VDS_FLT to 1b. Normal operation resumes after the VDS_OCP condition is cleared and a clear fault command is issued through the CLR_FLT bit.