SLAS701B November 2010 – June 2018 MSP430AFE221 , MSP430AFE222 , MSP430AFE223 , MSP430AFE231 , MSP430AFE232 , MSP430AFE233 , MSP430AFE251 , MSP430AFE252 , MSP430AFE253
PRODUCTION DATA.
Table 4-1 describes the signals for all device variants.
TERMINAL | I/O | DESCRIPTION | |
---|---|---|---|
NAME | NO. | ||
A0.0+ | 1 | I | SD24_A positive analog input A0.0(1) |
A0.0- | 2 | I | SD24_A negative analog input A0.0(1) |
A1.0+ | 3 | I | SD24_A positive analog input A1.0 (not available on MSP430AFE2x1)(1) |
A1.0- | 4 | I | SD24_A negative analog input A1.0 (not available on MSP430AFE2x1)(1) |
AVCC | 5 | Analog supply voltage, positive terminal. Must not power up prior to DVCC. | |
AVSS | 6 | Analog supply voltage, negative terminal | |
VREF | 7 | I/O | Input for an external reference voltage
output for internal reference voltage (can be used as mid-voltage) |
A2.0+ | 8 | I | SD24_A positive analog input A2.0 (not available on MSP430AFE2x2 and MSP430AFE2x1)(1) |
A2.0- | 9 | I | SD24_A negative analog input A2.0 (not available on MSP430AFE2x2 and MSP430AFE2x1)(1) |
TEST/SBWTCK | 10 | I | Selects test mode for JTAG pins on P1.5 to P1.7 and P2.0.
The device protection fuse is connected to TEST. Spy-Bi-Wire test clock input for device programming and test. |
RST/NMI/SBWTDIO | 11 | I | Reset or nonmaskable interrupt input
Spy-Bi-Wire test data input/output for device programming and test. |
P1.0/SVSIN/TACLK/SMCLK/TA2 | 12 | I/O | General-purpose digital I/O pin
Analog input to supply voltage supervisor Timer_A3, clock signal TACLK input SMCLK signal output Timer_A3, compare: Out2 Output |
DVSS | 13 | Digital supply voltage, negative terminal | |
P2.6/XT2IN | 14 | I/O | Input terminal of crystal oscillator
General-purpose digital I/O pin |
P2.7/XT2OUT | 15 | I/O | Output terminal of crystal oscillator
General-purpose digital I/O pin |
DVCC | 16 | Digital supply voltage, positive terminal. | |
P1.1/TA1/SDCLK | 17 | I/O | General-purpose digital I/O pin
Timer_A3, capture: CCI1A and CCI1B inputs, compare: Out1 output SD24_A bit stream clock output |
P1.2/TA0/SD0DO | 18 | I/O | General-purpose digital I/O pin
Timer_A3, capture: CCI0A and CCI0B inputs, compare: Out0 output SD24_A bit stream data output for channel 0 |
P1.3/UTXD0/SD1DO | 19 | I/O | General-purpose digital I/O pin
Transmit data out - USART0 in UART mode SD24_A bit stream data output for channel 1 (not available on MSP430AFE2x1) |
P1.4/URXD0/SD2DO | 20 | I/O | General-purpose digital I/O pin
Receive data in - USART0 in UART mode SD24_A bit stream data output for channel 2 (not available on MSP430AFE2x2 and MSP430AFE2x1) |
P1.5/SIMO0/SVSOUT/TMS | 21 | I/O | General-purpose digital I/O
Slave in/master out of USART0 in SPI mode SVS: output of SVS comparator JTAG test mode select. TMS is used as an input port for device programming and test. |
P1.6/SOMI0/TA2/TCK | 22 | I/O | General-purpose digital I/O pin
Slave out/master in of USART0 in SPI mode Timer_A3, compare: Out2 output JTAG test clock. TCK is the clock input port for device programming and test. |
P1.7/UCLK0/TA1/TDO/TDI | 23 | I/O | General-purpose digital I/O pin
External clock input - USART0 in UART or SPI mode, clock output - USART0/SPI mode. Timer_A3, compare: Out1 output JTAG test data output port. TDO/TDI data output or programming data input terminal. |
P2.0/STE0/TA0/TDI/TCLK | 24 | I/O | General-purpose digital I/O pin
Slave transmit enable - USART0 in SPI mode. Timer_A3, compare: Out0 output JTAG test data input or test clock input for device programming and test. |