2 Revision History
Changes from October 1, 2013 to September 26, 2018
- Document format and organization changes throughout document, including addition of section numberingGo
- Added Device Information tableGo
- Moved functional block diagram to Section 1.4Go
- Added Section 3.1, Related ProductsGo
- Added typical conditions statements at the beginning of Section 5, SpecificationsGo
- Added Section 5.2, ESD RatingsGo
- Added note to CVCORE in Section 5.3, Recommended Operating ConditionsGo
- Moved Section 5.6, Thermal Resistance CharacteristicsGo
- Changed the TYP value of the CL,eff parameter with Test Conditions of "XTS = 0, XCAPx = 0" from 2 pF to 1 pF in Section 5.15, Crystal Oscillator, XT1, Low-Frequency ModeGo
- Changed the MIN value of V(DVCC_BOR_hys) from 60 mV to 50 mV in Section 5.20, PMM, Brownout Reset (BOR)Go
- Updated notes (1) and (2) and added note (3) in Section 5.26, Wake-up Times From Low-Power Modes and ResetGo
- Removed ADC12DIV from the formula for the TYP value in the second row of the tCONVERT parameter in Section 5.36, 12-Bit ADC, Timing Parameters, because ADC12CLK is after divisionGo
- Added second row for the tEN_CMP parameter with Test Conditions of "CBPWRMD = 10" and MAX value of 100 µs and removed option for "CBPWRMD = 10" from first row of Test Conditions in Section 5.42, Comparator_BGo
- Changed all instances of "bootstrap loader" to "bootloader" throughout documentGo
- Added Section 7 and moved Tools Support, Device Nomenclature, ESD Caution, and Trademarks sections to itGo
- Replaced former Tools Support section with Section 7.3, Tools and SoftwareGo
- Added Section 8, Mechanical, Packaging, and Orderable InformationGo