SLAS655H January 2010 – May 2021 MSP430F5418A , MSP430F5419A , MSP430F5435A , MSP430F5436A , MSP430F5437A , MSP430F5438A
PRODUCTION DATA
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. | |
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |