2 Revision History
Changes from December 19, 2013 to September 28, 2018
- Document format changes throughout, including addition of section numbering Go
- Added Device Information tableGo
- Added Section 3, Device Comparison, and moved Table 3-1 to itGo
- Added Section 3.1, Related ProductsGo
- Added Section 4 and moved pinouts and terminal functions tables to itGo
- Corrected the port number (P4.2) on pin 61 in Figure 4-2, 100-Pin PZ Package (Top View)Go
- Added note to P1.3/ADC10CLK/A3 (pin 8) in Table 4-3, Terminal Functions – PEU PackageGo
- Added typical conditions statements at the beginning of Section 5, SpecificationsGo
- Moved all electrical specifications to Section 5Go
- Added SD24_B input pins and AUXVCCx pins to exception list on "Voltage applied to pins" parameter, and added SD24_B input pin limits in "Diode current at pins" parameter in Section 5.1, Absolute Maximum RatingsGo
- Added Section 5.2, ESD RatingsGo
- Added note to CVCOREGo
- Added Section 5.7, Thermal Packaging CharacteristicsGo
- Changed the TYP value of the CL,eff parameter with Test Conditions of "XTS = 0, XCAPx = 0" from 2 pF to 1 pF in Section 5.16, Crystal Oscillator, XT1, Low-Frequency ModeGo
- Updated notes (1) and (2) and added note (3) in Section 5.26, Wake-up Times From Low-Power Modes and ResetGo
- Corrected the names of the AUXVCC1, AUXVCC2, and AUXVCC3 pins in Auxiliary Supplies tablesGo
- Corrected the bit name in the Test Conditions of the RCHARGE parameter (changed CHCx to AUXCHCx) in Section 5.34, Auxiliary Supplies, Charge Limiting ResistorGo
- Replaced fFrame parameter with fLCD, fFRAME,4mux, and fFRAME,8mux parameters in Section 5.46, LCD_C Recommended Operating ConditionsGo
- On the VID,FS parameter in Section 5.48, SD24_B Power Supply and Recommended Operating Conditions: Changed the MIN value from "VREF/GAIN" to "–VREF/GAIN"; Removed "Unipolar mode" test condition (mode is not supported)Go
- Removed ADC10DIV from the formula for the TYP value in the second row of the tCONVERT parameter in Section 5.57, 10-Bit ADC Switching Characteristics, because ADC10CLK is after divisionGo
- Changed Test Conditions for all parameters in Section 5.58, 10-Bit ADC Linearity Parameters: Removed "VREF–"; Changed from "(VeREF+ – VeREF–)min ≤ (VeREF+ – VeREF–)" to "1.4 V ≤ (VeREF+ – VeREF–)"; Changed from "CVREF+ = 20 pF" to "CVeREF+ = 20 pF"; Added "CVeREF+ = 20 pF" to EI; Added "ADC10SREFx = 11b" to ET and EGGo
- Removed "VREF–" from the Test Conditions for the VeREF+, VeREF–, and (VeREF+ – VeREF–) parameters in Section 5.59, 10-Bit ADC External ReferenceGo
- Changed MIN value of AVCC(min) parameter with Test Conditions of "REFVSEL = {0} for 1.5 V" from 2.2 V to 1.8 V in Section 5.60, REF Built-In ReferenceGo
- Changed the MAX value of the tEN_CMP parameter with Test Conditions of "CBPWRMD = 10" from 50 µs to 100 µs in Section 5.61, Comparator_BGo
- Throughout document, changed all instances of "bootstrap loader" to "bootloader"Go
- Corrected spelling of NMIIFG in Table 6-13, System Module Interrupt Vector RegistersGo
- Added Section 7 and moved Development Tools Support, Device and Development Tool Nomenclature, and Trademarks sections to itGo
- Replaced former section Development Tools Support with Section 7.3, Tools and SoftwareGo
- Added Section 8, Mechanical, Packaging, and Orderable InformationGo