SLASE32C August   2014  – August 2018 MSP430FR5887 , MSP430FR5888 , MSP430FR5889 , MSP430FR58891 , MSP430FR6887 , MSP430FR6888 , MSP430FR6889 , MSP430FR68891

PRODUCTION DATA.  

  1. 1Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Device Comparison
    1. 3.1 Related Products
  4. 4Terminal Configuration and Functions
    1. 4.1 Pin Diagrams
    2. 4.2 Signal Descriptions
      1. Table 4-1 Signal Descriptions – MSP430FR688x and MSP430FR688x1
      2. Table 4-2 Signal Descriptions – MSP430FR588x and MSP430FR588x1
    3. 4.3 Pin Multiplexing
    4. 4.4 Connection of Unused Pins
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Active Mode Supply Current Into VCC Excluding External Current
    5. 5.5  Typical Characteristics, Active Mode Supply Currents
    6. 5.6  Low-Power Mode (LPM0, LPM1) Supply Currents Into VCC Excluding External Current
    7. 5.7  Low-Power Mode (LPM2, LPM3, LPM4) Supply Currents (Into VCC) Excluding External Current
    8. 5.8  Low-Power Mode With LCD Supply Currents (Into VCC) Excluding External Current
    9. 5.9  Low-Power Mode LPMx.5 Supply Currents (Into VCC) Excluding External Current
    10. 5.10 Typical Characteristics, Low-Power Mode Supply Currents
    11. 5.11 Typical Characteristics, Current Consumption per Module
    12. 5.12 Thermal Resistance Characteristics
    13. 5.13 Timing and Switching Characteristics
      1. 5.13.1 Power Supply Sequencing
        1. Table 5-1 Brownout and Device Reset Power Ramp Requirements
        2. Table 5-2 SVS
      2. 5.13.2 Reset Timing
        1. Table 5-3 Reset Input
      3. 5.13.3 Clock Specifications
        1. Table 5-4 Low-Frequency Crystal Oscillator, LFXT
        2. Table 5-5 High-Frequency Crystal Oscillator, HFXT
        3. Table 5-6 DCO
        4. Table 5-7 Internal Very-Low-Power Low-Frequency Oscillator (VLO)
        5. Table 5-8 Module Oscillator (MODOSC)
      4. 5.13.4 Wake-up Characteristics
        1. Table 5-9   Wake-up Times From Low-Power Modes and Reset
        2. Table 5-10 Typical Wake-up Charge
        3. 5.13.4.1    Typical Characteristics, Average LPM Currents vs Wake-up Frequency
      5. 5.13.5 Peripherals
        1. 5.13.5.1 Digital I/Os
          1. Table 5-11 Digital Inputs
          2. Table 5-12 Digital Outputs
          3. 5.13.5.1.1  Typical Characteristics, Digital Outputs at 3.0 V and 2.2 V
          4. Table 5-13 Pin-Oscillator Frequency, Ports Px
          5. 5.13.5.1.2  Typical Characteristics, Pin-Oscillator Frequency
        2. 5.13.5.2 Timer_A and Timer_B
          1. Table 5-14 Timer_A
          2. Table 5-15 Timer_B
        3. 5.13.5.3 eUSCI
          1. Table 5-16 eUSCI (UART Mode) Clock Frequency
          2. Table 5-17 eUSCI (UART Mode)
          3. Table 5-18 eUSCI (SPI Master Mode) Clock Frequency
          4. Table 5-19 eUSCI (SPI Master Mode)
          5. Table 5-20 eUSCI (SPI Slave Mode)
          6. Table 5-21 eUSCI (I2C Mode)
        4. 5.13.5.4 LCD Controller
          1. Table 5-22 LCD_C, Recommended Operating Conditions
          2. Table 5-23 LCD_C Electrical Characteristics
        5. 5.13.5.5 ADC
          1. Table 5-24 12-Bit ADC, Power Supply and Input Range Conditions
          2. Table 5-25 12-Bit ADC, Timing Parameters
          3. Table 5-26 12-Bit ADC, Linearity Parameters With External Reference
          4. Table 5-27 12-Bit ADC, Dynamic Performance for Differential Inputs With External Reference
          5. Table 5-28 12-Bit ADC, Dynamic Performance for Differential Inputs With Internal Reference
          6. Table 5-29 12-Bit ADC, Dynamic Performance for Single-Ended Inputs With External Reference
          7. Table 5-30 12-Bit ADC, Dynamic Performance for Single-Ended Inputs With Internal Reference
          8. Table 5-31 12-Bit ADC, Dynamic Performance With 32.768-kHz Clock
          9. Table 5-32 12-Bit ADC, Temperature Sensor and Built-In V1/2
          10. Table 5-33 12-Bit ADC, External Reference
        6. 5.13.5.6 Reference
          1. Table 5-34 REF, Built-In Reference
        7. 5.13.5.7 Comparator
          1. Table 5-35 Comparator_E
        8. 5.13.5.8 Scan Interface
          1. Table 5-36 Extended Scan Interface, Port Drive, Port Timing
          2. Table 5-37 Extended Scan Interface, Sample Capacitor/Ri Timing
          3. Table 5-38 Extended Scan Interface, VCC/2 Generator
          4. Table 5-39 Extended Scan Interface, 12-Bit DAC
          5. Table 5-40 Extended Scan Interface, Comparator
          6. Table 5-41 Extended Scan Interface, ESICLK Oscillator and TSM Clock Signals
        9. 5.13.5.9 FRAM Controller
          1. Table 5-42 FRAM
      6. 5.13.6 Emulation and Debug
        1. Table 5-43 JTAG and Spy-Bi-Wire Interface
  6. 6Detailed Description
    1. 6.1  Overview
    2. 6.2  CPU
    3. 6.3  Operating Modes
      1. 6.3.1 Peripherals in Low-Power Modes
        1. 6.3.1.1 Idle Currents of Peripherals in LPM3 and LPM4
    4. 6.4  Interrupt Vector Table and Signatures
    5. 6.5  Bootloader (BSL)
    6. 6.6  JTAG Operation
      1. 6.6.1 JTAG Standard Interface
      2. 6.6.2 Spy-Bi-Wire Interface
    7. 6.7  FRAM
    8. 6.8  RAM
    9. 6.9  Tiny RAM
    10. 6.10 Memory Protection Unit Including IP Encapsulation
    11. 6.11 Peripherals
      1. 6.11.1  Digital I/O
      2. 6.11.2  Oscillator and Clock System (CS)
      3. 6.11.3  Power-Management Module (PMM)
      4. 6.11.4  Hardware Multiplier (MPY)
      5. 6.11.5  Real-Time Clock (RTC_C)
      6. 6.11.6  Watchdog Timer (WDT_A)
      7. 6.11.7  System Module (SYS)
      8. 6.11.8  DMA Controller
      9. 6.11.9  Enhanced Universal Serial Communication Interface (eUSCI)
      10. 6.11.10 Extended Scan Interface (ESI)
      11. 6.11.11 Timer_A TA0, Timer_A TA1
      12. 6.11.12 Timer_A TA2
      13. 6.11.13 Timer_A TA3
      14. 6.11.14 Timer_B TB0
      15. 6.11.15 ADC12_B
      16. 6.11.16 Comparator_E
      17. 6.11.17 CRC16
      18. 6.11.18 CRC32
      19. 6.11.19 True Random Seed
      20. 6.11.20 Shared Reference (REF_A)
      21. 6.11.21 LCD_C
      22. 6.11.22 Embedded Emulation
        1. 6.11.22.1 Embedded Emulation Module (EEM)
        2. 6.11.22.2 EnergyTrace++™ Technology
      23. 6.11.23 Input/Output Diagrams
        1. 6.11.23.1  Digital I/O Functionality – Ports P1 to P10
        2. 6.11.23.2  Capacitive Touch Functionality Ports P1 to P10 and PJ
        3. 6.11.23.3  Port P1 (P1.0 to P1.3) Input/Output With Schmitt Trigger
        4. 6.11.23.4  Port P1 (P1.4 to P1.7) Input/Output With Schmitt Trigger
        5. 6.11.23.5  Port P2 (P2.0 to P2.3) Input/Output With Schmitt Trigger
        6. 6.11.23.6  Port P2 (P2.4 to P2.7) Input/Output With Schmitt Trigger
        7. 6.11.23.7  Port P3 (P3.0 to P3.7) Input/Output With Schmitt Trigger
        8. 6.11.23.8  Port P4 (P4.0 to P4.7) Input/Output With Schmitt Trigger
        9. 6.11.23.9  Port P5 (P5.0 to P5.7) Input/Output With Schmitt Trigger
        10. 6.11.23.10 Port P6 (P6.0 to P6.6) Input/Output With Schmitt Trigger
        11. 6.11.23.11 Port P6 (P6.7) Input/Output With Schmitt Trigger
        12. 6.11.23.12 Port P7 (P7.0 to P7.7) Input/Output With Schmitt Trigger
        13. 6.11.23.13 Port P8 (P8.0 to P8.3) Input/Output With Schmitt Trigger
        14. 6.11.23.14 Port P8 (P8.4 to P8.7) Input/Output With Schmitt Trigger
        15. 6.11.23.15 Port P9 (P9.0 to P9.3) Input/Output With Schmitt Trigger
        16. 6.11.23.16 Port P9 (P9.4 to P9.7) Input/Output With Schmitt Trigger
        17. 6.11.23.17 Port P10 (P10.0 to P10.2) Input/Output With Schmitt Trigger
        18. 6.11.23.18 Port PJ (PJ.4 and PJ.5) Input/Output With Schmitt Trigger
        19. 6.11.23.19 Port PJ (PJ.6 and PJ.7) Input/Output With Schmitt Trigger
        20. 6.11.23.20 Port PJ (PJ.0 to PJ.3) JTAG Pins TDO, TMS, TCK, TDI/TCLK, Input/Output With Schmitt Trigger
    12. 6.12 Device Descriptors (TLV)
    13. 6.13 Memory
      1. 6.13.1 Peripheral File Map
    14. 6.14 Identification
      1. 6.14.1 Revision Identification
      2. 6.14.2 Device Identification
      3. 6.14.3 JTAG Identification
  7. 7Applications, Implementation, and Layout
    1. 7.1 Device Connection and Layout Fundamentals
      1. 7.1.1 Power Supply Decoupling and Bulk Capacitors
      2. 7.1.2 External Oscillator
      3. 7.1.3 JTAG
      4. 7.1.4 Reset
      5. 7.1.5 Unused Pins
      6. 7.1.6 General Layout Recommendations
      7. 7.1.7 Do's and Don'ts
    2. 7.2 Peripheral- and Interface-Specific Design Information
      1. 7.2.1 ADC12_B Peripheral
        1. 7.2.1.1 Partial Schematic
        2. 7.2.1.2 Design Requirements
        3. 7.2.1.3 Detailed Design Procedure
        4. 7.2.1.4 Layout Guidelines
      2. 7.2.2 LCD_C Peripheral
        1. 7.2.2.1 Partial Schematic
        2. 7.2.2.2 Design Requirements
        3. 7.2.2.3 Detailed Design Procedure
        4. 7.2.2.4 Layout Guidelines
      3. 7.2.3 Extended Scan Interface (ESI) Peripheral
        1. 7.2.3.1 Overview
        2. 7.2.3.2 Design Requirements
        3. 7.2.3.3 Detailed Design Procedure
        4. 7.2.3.4 Layout Guidelines
  8. 8Device and Documentation Support
    1. 8.1  Getting Started and Next Steps
    2. 8.2  Device Nomenclature
    3. 8.3  Tools and Software
    4. 8.4  Documentation Support
    5. 8.5  Related Links
    6. 8.6  Community Resources
    7. 8.7  Trademarks
    8. 8.8  Electrostatic Discharge Caution
    9. 8.9  Export Control Notice
    10. 8.10 Glossary
  9. 9Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.2.1.2 Design Requirements

As with any high-resolution ADC, appropriate PCB layout and grounding techniques should be followed to eliminate ground loops, unwanted parasitic effects, and noise.

Ground loops are formed when return current from the ADC flows through paths that are common with other analog or digital circuitry. If care is not taken, this current can generate small unwanted offset voltages that can add to or subtract from the reference or input voltages of the ADC. The general guidelines in Section 7.1.1 combined with the connections shown in Section 7.2.1.1 prevent this.

In addition to grounding, ripple and noise spikes on the power-supply lines that are caused by digital switching or switching power supplies can corrupt the conversion result. A noise-free design using separate analog and digital ground planes with a single-point connection is recommend to achieve high accuracy.

Figure 7-5 shows the recommended decoupling circuit when an external voltage reference is used. The internal reference module has a maximum drive current as specified in the Reference module's IO(VREF+) specification.

The reference voltage must be a stable voltage for accurate measurements. The capacitor values that are selected in the general guidelines filter out the high- and low-frequency ripple before the reference voltage enters the device. In this case, the 10-µF capacitor is used to buffer the reference pin and filter any low-frequency ripple. A 470-nF bypass capacitor is used to filter out any high-frequency noise.