SLASEV3 Data sheet

SLASEV3A March 2020 – December 2020 MSP430FR6005 , MSP430FR6007

PRODUCTION DATA

Package Options

Mechanical Data (Package|Pins)

PZ|100
- MTQF013A

Thermal pad, mechanical data (Package|Pins)

PZ|100
- QFND428

Orderable Information

9.15 Device Descriptors (TLV)

Table 9-43 lists the Device IDs.

Table 9-43 Device IDs

DEVICE	PACKAGE	DEVICE ID
DEVICE	PACKAGE	01A05h	01A04h
MSP430FR6007	PZ	83h	2Eh
MSP430FR6005	PZ	83h	2Fh

Table 9-44 lists the contents of the device descriptor tag-length-value (TLV) structure.

Table 9-44 Device Descriptors

	DESCRIPTION	MSP430FR60xx (UART BSL)⁽¹⁾
	DESCRIPTION	ADDRESS	VALUE
Info Block	Info length	01A00h	06h
	CRC length	01A01h	06h
	CRC value	01A02h	Per unit
	CRC value	01A03h	Per unit
	Device ID	01A04h	See Table 9-43.
	Device ID	01A05h	See Table 9-43.
	Hardware revision	01A06h	Per unit
	Firmware revision	01A07h	Per unit
Die Record	Die record tag	01A08h	08h
	Die record length	01A09h	0Ah
	Lot/wafer ID	01A0Ah	Per unit
		01A0Bh	Per unit
		01A0Ch	Per unit
		01A0Dh	Per unit
	Die X position	01A0Eh	Per unit
	Die X position	01A0Fh	Per unit
	Die Y position	01A10h	Per unit
	Die Y position	01A11h	Per unit
	Test results	01A12h	Per unit
	Test results	01A13h	Per unit
ADC12 Calibration	ADC12 calibration tag	01A14h	11h
	ADC12 calibration length	01A15h	10h
	ADC gain factor⁽²⁾	01A16h	Per unit
	ADC gain factor⁽²⁾	01A17h	Per unit
	ADC offset⁽³⁾	01A18h	Per unit
	ADC offset⁽³⁾	01A19h	Per unit
	ADC 1.2-V reference temperature sensor 30°C	01A1Ah	Per unit
	ADC 1.2-V reference temperature sensor 30°C	01A1Bh	Per unit
	ADC 1.2-V reference temperature sensor 85°C	01A1Ch	Per unit
	ADC 1.2-V reference temperature sensor 85°C	01A1Dh	Per unit
	ADC 2.0-V reference temperature sensor 30°C	01A1Eh	Per unit
	ADC 2.0-V reference temperature sensor 30°C	01A1Fh	Per unit
	ADC 2.0-V reference temperature sensor 85°C	01A20h	Per unit
	ADC 2.0-V reference temperature sensor 85°C	01A21h	Per unit
	ADC 2.5-V reference temperature sensor 30°C	01A22h	Per unit
	ADC 2.5-V reference temperature sensor 30°C	01A23h	Per unit
	ADC 2.5-V reference temperature sensor 85°C	01A24h	Per unit
	ADC 2.5-V reference temperature sensor 85°C	01A25h	Per unit
REF Calibration	REF calibration tag	01A26h	12h
	REF calibration length	01A27h	06h
	REF 1.2-V reference	01A28h	Per unit
	REF 1.2-V reference	01A29h	Per unit
	REF 2.0-V reference	01A2Ah	Per unit
	REF 2.0-V reference	01A2Bh	Per unit
	REF 2.5-V reference	01A2Ch	Per unit
	REF 2.5-V reference	01A2Dh	Per unit
Random Number	128-bit random number tag	01A2Eh	15h
	Random number length	01A2Fh	10h
	128-bit random number⁽⁴⁾	01A30h	Per unit
		01A31h	Per unit
		01A32h	Per unit
		01A33h	Per unit
		01A34h	Per unit
		01A35h	Per unit
		01A36h	Per unit
		01A37h	Per unit
		01A38h	Per unit
		01A39h	Per unit
		01A3Ah	Per unit
		01A3Bh	Per unit
		01A3Ch	Per unit
		01A3Dh	Per unit
		01A3Eh	Per unit
		01A3Fh	Per unit
BSL Configuration	BSL tag	01A40h	1Ch
	BSL length	01A41h	02h
	BSL interface	01A42h	00h
	BSL interface configuration	01A43h	00h

(1) NA = Not applicable, Per unit = content can differ from device to device

(2) ADC gain: The gain correction factor is measured at room temperature using a 2.5-V external voltage reference without internal buffer (ADC12VRSEL = 0x2, 0x4, or 0xE). Other settings (for example, using internal reference) can result in different correction factors.

(3) ADC offset: the offset correction factor is measured at room temperature using ADC12VRSEL= 0x2 or 0x4, an external reference, V_R+ = external 2.5 V, V_R– = AVSS.

(4) 128-bit random number: The random number is generated during production test using the Microsoft® CryptGenRandom() function.