SLASFA2 November   2024 MSPM0G3519

ADVANCE INFORMATION  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Functional Block Diagram
  6. 5 Device Comparison
    1. 5.1 Device Comparison Chart
  7. 6 Pin Configuration and Functions
    1. 6.1 Pin Diagrams
    2. 6.2 Pin Attributes
      1.      11
    3. 6.3 Signal Descriptions
      1.      13
      2.      14
      3.      15
      4.      16
      5.      17
      6.      18
      7.      19
      8.      20
      9.      21
      10.      22
      11.      23
      12.      24
      13.      25
      14.      26
      15.      27
      16.      28
      17.      29
    4. 6.4 Connections for Unused Pins
  8. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Supply Current Characteristics
      1. 7.5.1 RUN/SLEEP Modes
      2. 7.5.2 STOP/STANDBY Modes
      3. 7.5.3 SHUTDOWN Mode
    6. 7.6  Power Supply Sequencing
      1. 7.6.1 Power Supply Ramp
      2. 7.6.2 POR and BOR
    7. 7.7  Flash Memory Characteristics
    8. 7.8  Timing Characteristics
    9. 7.9  Clock Specifications
      1. 7.9.1 System Oscillator (SYSOSC)
      2. 7.9.2 Low Frequency Oscillator (LFOSC)
        1. 7.9.2.1 SYSOSC Typical Frequency Accuracy
      3. 7.9.3 System Phase Lock Loop (SYSPLL)
      4. 7.9.4 Low Frequency Crystal/Clock
      5. 7.9.5 High Frequency Crystal/Clock
    10. 7.10 Digital IO
      1. 7.10.1  Electrical Characteristics
      2. 7.10.2 Switching Characteristics
    11. 7.11 Analog Mux VBOOST
    12. 7.12 ADC
      1. 7.12.1 Electrical Characteristics
      2. 7.12.2 Switching Characteristics
      3. 7.12.3 Linearity Parameters
      4. 7.12.4 Typical Connection Diagram
    13. 7.13 Temperature Sensor
    14. 7.14 VREF
      1. 7.14.1 Voltage Characteristics
      2. 7.14.2 Electrical Characteristics
    15. 7.15 Comparator (COMP)
      1. 7.15.1 Comparator Electrical Characteristics
    16. 7.16 DAC
      1. 7.16.1 DAC_Supply Specifications
      2. 7.16.2 DAC Output Specifications
      3. 7.16.3 DAC Dynamic Specifications
      4. 7.16.4 DAC Linearity Specifications
      5. 7.16.5 DAC Timing Specifications
    17. 7.17 I2C
      1. 7.17.1 I2C Characteristics
      2. 7.17.2 I2C Filter
      3. 7.17.3 I2C Timing Diagram
    18. 7.18 SPI
      1. 7.18.1 SPI
      2. 7.18.2 SPI Timing Diagram
    19. 7.19 UART
    20. 7.20 TIMx
    21. 7.21 TRNG
      1. 7.21.1 TRNG Electrical Characteristics
      2. 7.21.2 TRNG Switching Characteristics
    22. 7.22 Emulation and Debug
      1. 7.22.1 SWD Timing
  9. 8 Detailed Description
    1. 8.1  Functional Block Diagram
    2. 8.2  CPU
    3. 8.3  Operating Modes
      1. 8.3.1 Functionality by Operating Mode (MSPM0Gx51x)
    4. 8.4  Security
    5. 8.5  Power Management Unit (PMU)
    6. 8.6  Clock Module (CKM)
    7. 8.7  DMA
    8. 8.8  Events
    9. 8.9  Memory
      1. 8.9.1 Memory Organization
      2. 8.9.2 Peripheral File Map
      3. 8.9.3 Peripheral Interrupt Vector
    10. 8.10 Flash Memory
    11. 8.11 SRAM
    12. 8.12 GPIO
    13. 8.13 IOMUX
    14. 8.14 ADC
    15. 8.15 Temperature Sensor
    16. 8.16 Low-Frequency Sub System (LFSS)
    17. 8.17 VREF
    18. 8.18 COMP
    19. 8.19 DAC
    20. 8.20 TRNG
    21. 8.21 AESADV
    22. 8.22 Keystore
    23. 8.23 CRC-P
    24. 8.24 MATHACL
    25. 8.25 UART
    26. 8.26 I2C
    27. 8.27 SPI
    28. 8.28 CAN-FD
    29. 8.29 IWDT_B
    30. 8.30 WWDT
    31. 8.31 RTC_B
    32. 8.32 Timers (TIMx)
    33. 8.33 Device Analog Connections
    34. 8.34 Input/Output Diagrams
    35. 8.35 Serial Wire Debug Interface
    36. 8.36 Boot Strap Loader (BSL)
    37. 8.37 Device Factory Constants
    38. 8.38 Identification
  10. 9 Applications, Implementation, and Layout
    1. 9.1 Typical Application
      1. 9.1.1 Schematic
  11. 10Device and Documentation Support
    1. 10.1 Getting Started and Next Steps
    2. 10.2 Device Nomenclature
    3. 10.3 Tools and Software
    4. 10.4 Documentation Support
    5. 10.5 Support Resources
    6. 10.6 Trademarks
    7. 10.7 Electrostatic Discharge Caution
    8. 10.8 Glossary
  12. 11Mechanical, Packaging, and Orderable Information
  13. 12Revision History

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)

7.18.1 SPI

over operating free-air temperature range (unless otherwise noted)
PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT
SPI
fSPI SPI clock frequency Clock max speed >= 32MHz
1.62 < VDD < 3.6V
Peripheral or Controller mode		 16 MHz
fSPI SPI clock frequency Clock max speed >= 48MHz
1.62 < VDD < 2.7V
Peripheral or Controller mode with High speed IO		 24 MHz
fSPI SPI clock frequency Clock max speed >= 64MHz
2.7 < VDD < 3.6V
Peripheral or Controller mode with High speed IO		 32 MHz
DCSCK SCK Duty Cycle 40 50 60 %
Controller
tSCLK_H/L SCLK High or Low time  (tSPI/2) - 1 tSPI / 2 (tSPI/2) + 1 ns
tCS.LEAD CS lead-time, CS active to clock SPH=0 1 SPI Clock
tCS.LEAD CS lead-time, CS active to clock SPH=1 1/2 SPI Clock
tCS.LAG CS lag time, Last clock to CS inactive 1 SPI Clock
tCS.ACC CS access time, CS active to PICO data out 1/2 SPI Clock
tCS.DIS CS disable time, CS inactive to PICO high inpedance 1 SPI Clock
tSU.CI POCI input data setup time (1) 2.7 < VDD < 3.6V, delayed sampling enabled 1 ns
tSU.CI POCI input data setup time (1) 1.62 < VDD < 2.7V, delayed sampling enabled 1 ns
tSU.CI POCI input data setup time (1) 2.7 < VDD < 3.6V, no delayed sampling 29 ns
tSU.CI POCI input data setup time (1) 1.62 < VDD < 2.7V, no delayed sampling 37 ns
tHD.CI POCI input data hold time delayed sampling enabled 24 ns
tHD.CI POCI input data hold time no delayed sampling 0 ns
tVALID.CO PICO output data valid time (2) 10 ns
tHD.CO PICO output data hold time (3) 6 ns
Peripheral
tCS.LEAD CS lead-time, CS active to clock 11 ns
tCS.LAG CS lag time, Last clock to CS inactive 1 ns
tCS.ACC CS access time, CS active to POCI data out 26 ns
tCS.DIS CS disable time, CS inactive to POCI high inpedance 26 ns
tSU.PI PICO input data setup time 7 ns
tHD.PI PICO input data hold time 0 ns
tVALID.PO POCI output data valid time(2) 2.7 < VDD < 3.6V 25 ns
tVALID.PO POCI output data valid time(2) 1.62 < VDD < 2.7V 31 ns
tHD.PO POCI output data hold time(3) 5 ns
(1) The POCI input data setup time can be fully compensated when delayed sampling feature is enabled.
(2) Specifies the time to drive the next valid data to the output after the output changing SCLK clock edge
(3) Specifies how long data on the output is valid after the output changing SCLK clock edge