4 Revision History
Changes from B Revision (September 2016) to C Revision
- Deleted automotive (Q1) device test conditions from plots in this commercial device data sheet Go
Changes from A Revision (March 2013) to B Revision
- Added Device Information, Device Comparison, ESD Ratings, and Recommended Operating Conditions tables, and Detailed Description, Applications and Implementation, Power Supply Recommendations, Layout, Device and Documentation Support, and Mechanical, Packaging, and Orderable Information sectionsGo
- Deleted Package Information table; all information now available in the package option addendum at the end of the data sheet Go
- Changed input bias current maximum value for over-temperature test condition in Electrical CharacteristicsGo
- Changed input offset current maximum value for over-temperature test condition in Electrical CharacteristicsGo
- Changed quiescent current values in Electrical CharacteristicsGo
- Changed input bias current maximum value for over-temperature test condition in Electrical CharacteristicsGo
- Changed input offset current maximum value for over-temperature test condition in Electrical CharacteristicsGo
- Changed quiescent current maximum values in Electrical CharacteristicsGo
Changes from * Revision (March 2013) to A Revision
- Changed document status to Production DataGo