4 Revision History
Changes from Revision B (April 2015) to Revision C (February 2023)
- Updated the numbering format for tables, figures, and
cross-references throughout the documentGo
- Changed Applications bullets to include
linksGo
- Deleted text regarding identical specification for the single, dual,
and quad versionsGo
- Changed Offset Trim pin type from "Input" to "—"Go
- Changed "DFN" to "DRM (VSON)" in OPA2277 Pin Functions
tableGo
- Added table note for 10-mA current limit on input pins in Absolute Maxiimum Ratings
Go
- Deleted operating temperature from Absolute Maximum Ratings
Go
- Deleted lead temperature from Absolute Maximum Ratings
Go
- Changed Thermal Information values for OPA2277 and OPA4277 SOIC packages.Go
- Added test conditions to Electrical Characteristics headerGo
- Changed format of Electrical Characteristcs for readabilityGo
- Changed input offset voltage vs. time to long-term drift in Electrical Characteristics
Go
- Changed input bias current test condition to separate over temperature specificationGo
- Deleted redundant row in open-loop gain parameterGo
- Changed CLOAD to CL for consistencyGo
- Changed Figure 6-14, Change in Input Bias Current vs Common-Mode
Voltage, to correct typo in noteGo
- Changed "DFN package" to "DRM package (8-pin VSON)"Go
- Changed "DFN package" to "DRM Package" and added "8-Pin
VSON"Go
- Changed Development Support section to show updated links and
resourcesGo
Changes from Revision A (April 2005) to Revision B (April 2015)
- Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section.Go