SBAS704B June   2015  – October 2015 OPT8241

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Switching Characteristics
    8. 6.8 Optical Characteristics
    9. 6.9 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Output Block
        1. 7.3.1.1 Serializer and LVDS Output Interface
        2. 7.3.1.2 Parallel CMOS Output Interface
      2. 7.3.2 Temperature Sensor
    4. 7.4 Device Functional Modes
    5. 7.5 Programming
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Presence Detection for Industrial Safety
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 Frequencies of Operation
          2. 8.2.1.2.2 Number of Sub-Frames and Quads
          3. 8.2.1.2.3 Field of View (FoV)
          4. 8.2.1.2.4 Lens
          5. 8.2.1.2.5 Integration Duty Cycle
          6. 8.2.1.2.6 Design Summary
        3. 8.2.1.3 Application Curve
      2. 8.2.2 People Counting and Locating
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Detailed Design Procedure
          1. 8.2.2.2.1 Frequencies of Operation
          2. 8.2.2.2.2 Number of Sub-Frames and Quads
          3. 8.2.2.2.3 Field of View (FoV)
          4. 8.2.2.2.4 Lens
          5. 8.2.2.2.5 Integration Duty Cycle
          6. 8.2.2.2.6 Design Summary
        3. 8.2.2.3 Application Curve
      3. 8.2.3 People Locating and Identification
        1. 8.2.3.1 Design Requirements
        2. 8.2.3.2 Detailed Design Procedure
          1. 8.2.3.2.1 Frequencies of Operation
          2. 8.2.3.2.2 Number of Sub-Frames and Quads
          3. 8.2.3.2.3 Field of View (FoV)
          4. 8.2.3.2.4 Lens
          5. 8.2.3.2.5 Integration Duty Cycle
          6. 8.2.3.2.6 Design Summary
        3. 8.2.3.3 Application Curve
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 MIX Supply Decapacitors
      2. 10.1.2 LVDS Transmitters
      3. 10.1.3 Optical Centering
      4. 10.1.4 Image Orientation
      5. 10.1.5 Thermal Considerations
    2. 10.2 Layout Example
    3. 10.3 Mechanical Assembly Guidelines
      1. 10.3.1 Board-Level Reliability
      2. 10.3.2 Handling
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Community Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

11 Device and Documentation Support

11.1 Documentation Support

11.1.1 Related Documentation

OPT9221 Data Sheet, SBAS703

Introduction to the Time-of-Flight (ToF) System Design, SBAU219

11.2 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.

11.3 Trademarks

E2E is a trademark of Texas Instruments.

All other trademarks are the property of their respective owners.

11.4 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

11.5 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.