SBAS495D June 2010 – August 2021 PCM9211
PRODUCTION DATA
MIN | NOM | MAX | UNIT | ||
---|---|---|---|---|---|
RST PIN DEVICE RESET REQUIREMENTS, Figure 7-1 | |||||
tRSTL | RST pulse width ( RST pin = low) | 1 | µs | ||
ADC SYSTEM CLOCK INPUT(1), Figure 7-3 | |||||
tSCY | System clock cycle time | 30 | ns | ||
tSCH | System clock high time | 0.4 tSCY | ns | ||
tSCL | System clock low time | 0.4 tSCY | ns | ||
System clock duty cycle | 40% | 60% | |||
AUDIO DATA INTERFACE, SLAVE MODE(2), Figure 7-5 | |||||
tBCY | BCK cycle time | 75 | ns | ||
tBCH | BCK high time | 35 | ns | ||
tBCL | BCK low time | 35 | ns | ||
tLRS | LRCK setup time to BCK rising edge | 10 | ns | ||
tLRH | LRCK hold time to BCK rising edge | 10 | ns | ||
tDOD | DOUT delay time from BCK falling edge | 10 | 70 | ns | |
AUDIO DATA INTERFACE, MASTER MODE(2), Figure 7-6 | |||||
tBCY | BCK cycle time | 1/64fS | |||
tBCH | BCK high time | 0.4 tBCY | 0.5 tBCY | 0.6 tBCY | |
tBCL | BCK low time | 0.4 tBCY | 0.5 tBCY | 0.6 tBCY | |
tLRD | LRCK delay time to BCK falling edge | 0 | 30 | ns | |
tDOD | DOUT delay time from BCK falling edge | 0 | 30 | ns | |
LATENCY BETWEEN INPUT BIPHASE AND LRCKO/DOUT, Figure 7-12 | |||||
tLATE | LRCKO/DOUT latency | 4/fS | s | ||
DIR DECODED AUDIO DATA OUTPUT(3), Figure 7-13 | |||||
tSCY | System clock pulse cycle time | 18 | ns | ||
tCKLR | Delay time of BCKO falling edge to LRCKO valid | –10 | 10 | ns | |
tBCY | BCKO pulse cycle time | 1/64fS | s | ||
tBCH | BCKO pulse width high | 60 | ns | ||
tBCL | BCKO pulse width low | 60 | ns | ||
tBCDO | Delay time of BCKO falling edge to DOUT valid | –10 | 10 | ns | |
tR | Rising time of all signals | 5 | ns | ||
tF | Falling time of all signals | 5 | ns | ||
CONTROL INTERFACE REQUIREMENTS, FOUR WIRE SCI, Figure 7-29 | |||||
tMCY | MC Pulse cycle time | 100 | ns | ||
tMCL | MC Low level time | 40 | ns | ||
tMCH | MC High level time | 40 | ns | ||
tMHH | MS High level time | tMCY | ns | ||
tMSS | MS Falling edge to MC rising edge | 30 | ns | ||
tMSH | MS Rising edge from MC rising edge for LSB | 15 | ns | ||
tMDH | MDI Hold time | 15 | ns | ||
tMDS | MDI Set-up time | 15 | ns | ||
tMDD | MDO Enable or delay time from MC falling edge | 0 | 30 | ns | |
tMDR | MDO Disable time from MS rising edge | 0 | 30 | ns | |
CONTROL INTERFACE, SCL AND SDA, STANDARD MODE, Figure 7-33 | |||||
fSCL | SCL clock frequency | 100 | kHz | ||
tBUF | Bus free time between STOP and START condition | 4.7 | µs | ||
tLOW | Low period of the SCL clock | 4.7 | µs | ||
tHI | High period of the SCL clock | 4 | µs | ||
tS-SU | Setup time for START/Repeated START condition | 4.7 | µs | ||
tS-HD | Hold time for START/Repeated START condition | 4 | µs | ||
tD-SU | Data setup time | 250 | ns | ||
tD-HD | Data hold time | 0 | 3450 | ns | |
tSCL-R | Rise time of SCL signal | 1000 | ns | ||
tSCL-F | Fall time of SCL signal | 1000 | ns | ||
tSDA-R | Rise time of SDA signal | 1000 | ns | ||
tSDA-F | Fall time of SDA signal | 1000 | ns | ||
tP-SU | Setup time for STOP condition | 4 | µs | ||
tGW | Allowable glitch width | NA | ns | ||
CB | Capacitive load for SDA and SCL line | 400 | pF | ||
VNH | Noise margin at High level for each connected device (including hysteresis) | 0.2 × VDD | V | ||
VNL | Noise margin at Low level for each connected device (including hysteresis) | 0.1 × VDD | V | ||
VHYS | Hysteresis of Schmitt-trigger input | NA | V | ||
CONTROL INTERFACE, SCL AND SDA, FAST MODE, Figure 7-33 | |||||
fSCL | SCL clock frequency | 400 | |||
tBUF | Bus free time between STOP and START condition | 1.3 | |||
tLOW | Low period of the SCL clock | 1.3 | |||
tHI | High period of the SCL clock | 0.6 | |||
tS-SU | Setup time for START/Repeated START condition | 0.6 | |||
tS-HD | Hold time for START/Repeated START condition | 0.6 | |||
tD-SU | Data setup time | 100 | |||
tD-HD | Data hold time | 0 | 900 | ||
tSCL-R | Rise time of SCL signal | 20 + 0.1 CB | 300 | ||
tSCL-F | Fall time of SCL signal | 20 + 0.1 CB | 300 | ||
tSDA-R | Rise time of SDA signal | 20 + 0.1 CB | 300 | ||
tSDA-F | Fall time of SDA signal | 20 + 0.1 CB | 300 | ||
tP-SU | Setup time for STOP condition | 0.6 | |||
tGW | Allowable glitch width | 50 | |||
CB | Capacitive load for SDA and SCL line | 100 | |||
VNH | Noise margin at High level for each connected device (including hysteresis) | 0.2 × VDD | |||
VNL | Noise margin at Low level for each connected device (including hysteresis) | 0.1 × VDD | |||
VHYS | Hysteresis of Schmitt-trigger input | 0.05 × VDD |