SLLSEI2A September 2017 – December 2017 SN55HVD233-SP
PRODUCTION DATA.
Refer to the PDF data sheet for device specific package drawings
TI recommends to have localized capacitive decoupling near device VCC pin to GND. Values of 4.7 µF at VCC pin and 10 µF, 1 µF, and 0.1 µF at supply have tested well on evaluation modules.