SLLS697B December   2005  – June 2021 SN65C3232E , SN75C3232E

PRODUCTION DATA  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Protection
    3. 6.3  ESD Protection, Driver
    4. 6.4  ESD Protection, Receiver
    5. 6.5  Recommended Operating Conditions
    6. 6.6  Thermal Information, SN65C3232E
    7. 6.7  Thermal Information, SN75C3232E
    8. 6.8  Electrical Characteristics, Power
    9. 6.9  Electrical Characteristics, Driver
    10. 6.10 Electrical Characteristics, Receiver
    11. 6.11 Switching Characteristics, Driver
    12. 6.12 Switching Characteristics, Receiver
  7. Parameter Measurement Information
  8. Detailed Description
    1. 8.1 Overview
      1. 8.1.1 Functional Block Diagram
      2. 8.1.2 Feature Description
        1. 8.1.2.1 Power
        2. 8.1.2.2 RS232 Driver
        3. 8.1.2.3 RS232 Receiver
      3. 8.1.3 Device Functional Modes
        1. 8.1.3.1 VCC Powered by 3 V to 5.5 V
        2. 8.1.3.2 VCC Unpowered, VCC = 0 V
  9. Application and Implenentation
    1. 9.1 Application Information
    2.     Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Performance Plots
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Receiving Notification of Documentation Updates
    2. 12.2 Support Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.