TEST PATTERN GENERATION PURPOSE ONLY registers are for test pattern generation use only. Others are for normal operation unless the test pattern generation feature is enabled. CHB* registers are used only when the device is configured for two stream mode ‐both LVDS output channels are enabled (CSR 0x18.4 = 0) and DSI channel mode configured as two stream (CSR 0x10.6:5 = 0X10b). CH*_SYNC_DELAY_HIGH/LOW registers are not used for test pattern generation. In all other configurations, CHA* registers are used for test pattern generation.
The CHB* register fields with a note This field is only applicable when CSR 0x10.6:5 = 10. are used only when the device is configured as two stream mode with CSR 0x18.4 = 0 and CSR 0x10.6:5 = 10.