SLASEE6 September 2016 SN65HVS883
PRODUCTION DATA.
MIN | MAX | UNIT | ||||
---|---|---|---|---|---|---|
V24 | Field power input | V24 | –0.3 | 36 | V | |
VIPx | Field digital inputs | IPx | –0.3 | 36 | V | |
VID | Voltage at any logic input | DB0, DB1, CLK, SIP, CE, LD | –0.5 | 6 | V | |
IO | Output current | CHOK, SOP | ±8 | mA | ||
PTOT | Continuous total power dissipation | See Thermal Information table | ||||
TJ | Junction temperature | 170 | °C |
VALUE | UNIT | ||||
---|---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | All pins | ±4000 | V |
IPx,V24 | ±15000 | ||||
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | All pins | ±1000 | |||
Machine Mode(3) | All pins | ±100 |
MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|
V24 | Field supply voltage | 10 | 24 | 34 | V |
VIPL | Field input low-state input voltage(1) | 0 | 4 | V | |
VIPH | Field input high-state input voltage(1) | 10 | 34 | V | |
VIL | Logic low-state input voltage | 0 | 0.8 | V | |
VIH | Logic high-state input voltage | 2 | 5.5 | V | |
RLIM | Current limiter resistor | 17 | 25 | 500 | kΩ |
fIP | Input data rate(2) | 0 | 1 | Mbps | |
TJ | 150 | °C | |||
TA | –40 | 85 | °C |
THERMAL METRIC(1) | SN65HVS883 | UNIT | ||
---|---|---|---|---|
PWP (HTSSOP) | ||||
28 PINS | ||||
RθJA | Junction-to-ambient thermal resistance | 35 | °C/W | |
RθJC(top) | Junction-to-case (top) thermal resistance | 4.27 | °C/W | |
RθJB | Junction-to-board thermal resistance | 15 | °C/W | |
PD | Device power dissipation | ILOAD = 50 mA, RIN = 0, IPO–IP7 = V24 = 30 V, RE7 = FGND, fCLK = 100 MHz, IIP-LIM and ICC = worst case with RLIM = 25 kΩ |
2591 | mW |
SYMBOL | PARAMETER | PIN | TEST CONDITIONS | MIN | TYP | MAX | UNIT |
---|---|---|---|---|---|---|---|
VTH–(IP) | Low-level device input threshold voltage | IP0–IP7 | 18 V< V24 < 34 V, RIN = 0 Ω , RLIM = 25 kΩ |
4 | 4.3 | V | |
VTH+(IP) | High-level device input threshold voltage | 5.2 | 5.5 | V | |||
VHYS(IP) | Device input hysteresis | 0.9 | V | ||||
VTH–(IN) | Low-level field input threshold voltage | measured at field side of RIN |
18 V < V24 < 34 V, RIN = 1.2 kΩ ± 5%, RLIM = 25 kΩ |
6 | 8.4 | V | |
VTH+(IN) | High-level field input threshold voltage | 9.4 | 10 | V | |||
VHYS(IN) | Field input hysteresis | 1 | V | ||||
VTH–(V24) | Low-level V24-monitor threshold voltage | V24 | 15 | 16.05 | V | ||
VTH+(V24) | High-level V24-monitor threshold voltage | 16.8 | 18 | V | |||
VHYS(V24) | V24-monitor hysteresis | 0.75 | V | ||||
RIP | Input resistance | IP0–IP7 | 3 V < VIPx < 6 V, RIN = 1.2 kΩ ± 5%, RLIM = 25 kΩ |
1.4 | 1.83 | 2.3 | kΩ |
IIP-LIM | Input current limit | 10 V < VIPx < 34 V, RLIM = 25 kΩ |
3.15 | 3.6 | 4 | mA | |
VOL | Logic low-level output voltage | SOP, CHOK | IOL = 20 μA | 0.4 | V | ||
VOH | Logic high-level output voltage | IOH = –20 μA | 4 | V | |||
IIL | Logic input leakage current | DB0, DB1, SIP, LD, CE, CLK |
–50 | 50 | μA | ||
IRE-on | RE on-state current | RE0–RE7 | RLIM = 25 kΩ, REX = FGND |
2.8 | 3.15 | 3.5 | mA |
ICC(V24) | Supply current | V24 | IP0 to IP7 = V24, 5VOP = open, REX = FGND, All logic inputs open |
8.7 | mA | ||
VO(5V) | Linear regulator output voltage | 5VOP | 18 V < V24 < 34 V, no load |
4.5 | 5 | 5.5 | V |
18 V < V24 < 34 V, IL = 50 mA |
4.5 | 5 | 5.5 | ||||
ILIM(5V) | Linear regulator output current limit | 115 | mA | ||||
ΔV5/ΔV24 | Line regulation | 5VOP, V24 | 18 V < V24 < 34 V, IL = 5 mA |
2 | mV/V | ||
tDB | Debounce times of input channels | IP0–IP7 | DB0 = open, DB1 = FGND |
0 | ms | ||
DB0 = FGND, DB1 = open |
1 | ||||||
DB0 = DB1 = open | 3 | ||||||
tDB-HL | Voltage monitor debounce time after V24 < 15 V (CHOK turns low) | V24, CHOK | 1 | ms | |||
tDB-LH | Voltage monitor debounce time after V24 > 18 V (CHOK turns high) | 6 | ms | ||||
TSHDN | Shutdown temperature | 170 | °C |
SYMBOL | PARAMETER | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tW1 | CLK pulse width | See Figure 9 | 4 | ns | ||
tW2 | LD pulse width | See Figure 7 | 6 | ns | ||
tSU1 | SIP to CLK setup time | See Figure 10 | 4 | ns | ||
tH1 | SIP to CLK hold time | See Figure 10 | 2 | ns | ||
tSU2 | Falling edge to rising edge (CE to CLK) setup time | See Figure 11 | 4 | ns | ||
tREC | LD to CLK recovery time | See Figure 8 | 2 | ns | ||
fCLK | Clock pulse frequency (50% duty cycle) | See Figure 9 | DC | 100 | MHz |
SYMBOL | PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT |
---|---|---|---|---|---|---|
tPLH1, tPHL1 | CLK to SOP | CL = 15 pF, see Figure 9 | 10 | ns | ||
tPLH2, tPHL2 | LD to SOP | CL = 15 pF, see Figure 7 | 14 | ns | ||
tr, tf | Rise and fall times | CL = 15 pF, see Figure 9 | 5 | ns |
RIN = 1.2 kΩ | a) IIP-LIM = 2.5 mA (RLIM = 36.1 kΩ) | |||
b) IIP-LIM = 3.0 mA (RLIM = 30.1 kΩ) | ||||
c) IIP-LIM = 3.6 mA (RLIM = 24.9 kΩ) |
V24 = 24 V | VIN = 24 V | RIN = 1.2 kΩ |
RLIM = 24.9 kΩ |
V24 = 24 V | RIN = 1.2 kΩ | RLIM = 24.9 kΩ |
ILOAD = 5 mA | TA = 27°C | |
RLOAD = 100 Ω | ||
ILOAD = 0 mA | ||