SLLS446G October   2000  – April 2024 SN65LBC174A , SN75LBC174A

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 Dissipation Rating Table
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
    7. 5.7 Typical Characteristics
  7. 6 Parameter Measure Information
  8. 7 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
  10. 9 Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • DW|16
  • N|16
  • DW|20
Thermal pad, mechanical data (Package|Pins)
Orderable Information

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
VALUE / UNIT
Supply voltage range, VCC(2)–0.3 V to 6 V
Voltage range at any bus (DC)–10 V to 15 V
Voltage range at any bus (transient pulse through 100 Ω, see Figure 6-8)–30 V to 30 V
Input voltage range at any A or EN terminal, VI–0.5 V to VCC + 0.5 V
Electrostatic dischargeHuman body model (3)Y, Z, and GND±12 kV
All pins±5 kV
Charged-device model (4)All pins±1 kV
Storage temperature range, Tstg–65°C to 150°C
Continuous power dissipationSee Dissipation Rating Table
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to GND.
(3) Tested in accordance with JEDEC standard 22, Test Method A114-A.
(4) Tested in accordance with JEDEC standard 22, Test Method C101.