SLLSF55A
March 2018 – May 2018
SN65LVDS93B
PRODUCTION DATA.
1
Features
2
Applications
3
Description
Device Images
RGB Video System Using Discrete LVDS TX
4
Revision History
5
Description (continued)
6
Pin Configuration and Functions
Pin Functions
7
Specifications
7.1
Absolute Maximum Ratings
7.2
ESD Ratings
7.3
Recommended Operating Conditions
7.4
Thermal Information
7.5
Electrical Characteristics
7.6
Timing Requirements
7.7
Switching Characteristics
7.8
Typical Characteristics
8
Parameter Measurement Information
9
Detailed Description
9.1
Overview
9.2
Functional Block Diagram
9.3
Feature Description
9.3.1
TTL Input Data
9.3.2
LVDS Output Data
9.4
Device Functional Modes
9.4.1
Input Clock Edge
9.4.2
Low Power Mode
10
Application and Implementation
10.1
Application Information
10.2
Typical Application
10.2.1
Design Requirements
10.2.2
Detailed Design Procedure
10.2.2.1
Power
10.2.2.2
Signal Connectivity
10.2.2.3
PCB Routing
10.2.3
Application Curve
11
Power Supply Recommendations
12
Layout
12.1
Layout Guidelines
12.1.1
Board Stackup
12.1.2
Power and Ground Planes
12.1.3
Traces, Vias, and Other PCB Components
12.2
Layout Example
13
Device and Documentation Support
13.1
Documentation Support
13.1.1
Related Documentation
13.2
Receiving Notification of Documentation Updates
13.3
Community Resources
13.4
Trademarks
13.5
Electrostatic Discharge Caution
13.6
Glossary
14
Mechanical, Packaging, and Orderable Information
Package Options
Mechanical Data (Package|Pins)
DGG|56
MPDS570
Thermal pad, mechanical data (Package|Pins)
Orderable Information
sllsf55a_oa
sllsf55a_pm
8
Parameter Measurement Information
Figure 3.
Equivalent Input and Output Schematic Diagrams
All input timing is defined at IOVDD / 2 on an input signal with a 10% to 90% rise or fall time of less than 3 ns. CLKSEL = 0V.
Figure 4.
Setup and Hold Time Definition
Figure 5.
Test Load and Voltage Definitions for LVDS Outputs
The 16 grayscale test pattern test device power consumption for a typical display pattern.
Figure 6.
16 Grayscale Test Pattern
The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs.
Figure 7.
Worst-Case Power Test Pattern
CLKOUT is shown with CLKSEL at high-level.
CLKIN polarity depends on CLKSEL input level.
Figure 8.
SN65LVDS93B Timing Definitions
Figure 9.
Output Clock Jitter Test Set Up
Figure 10.
Enable Time Waveforms
Figure 11.
Disable Time Waveforms