SLLS573E December   2003  – March 2024 SN65MLVD200A , SN65MLVD202A , SN65MLVD204A , SN65MLVD205A

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Electrical Characteristics – Driver
    7. 6.7  Electrical Characteristics – Receiver
    8. 6.8  Electrical Characteristics – BUS Input and Output
    9. 6.9  Switching Characteristics – Driver
    10. 6.10 Switching Characteristics – Receiver
    11. 6.11 Typical Characteristics
  8. 7 Parameter Measurement Information
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Power-On Reset
      2. 8.3.2 ESD Protection
    4. 8.4 Device Functional Modes
      1. 8.4.1 Device Function Tables
      2. 8.4.2 Equivalent Input and Output Schematic Diagrams
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1  Supply Voltage
        2. 9.2.2.2  Supply Bypass Capacitance
        3. 9.2.2.3  Driver Input Voltage
        4. 9.2.2.4  Driver Output Voltage
        5. 9.2.2.5  Termination Resistors
        6. 9.2.2.6  Receiver Input Signal
        7. 9.2.2.7  Receiver Input Threshold (Failsafe)
        8. 9.2.2.8  Receiver Output Signal
        9. 9.2.2.9  Interconnecting Media
        10. 9.2.2.10 PCB Transmission Lines
      3. 9.2.3 Application Curves
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Microstrip Versus Stripline Topologies
      2. 11.1.2 Dielectric Type and Board Construction
      3. 11.1.3 Recommended Stack Layout
      4. 11.1.4 Separation Between Traces
      5. 11.1.5 Crosstalk and Ground Bounce Minimization
      6. 11.1.6 Decoupling
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Support Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  14. 13Revision History
  15. 14Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • D|14
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7 Parameter Measurement Information

SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Driver Voltage and Current Definitions Figure 7-1 Driver Voltage and Current Definitions
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Differential Output Voltage Test Circuit
A. All resistors are 1% tolerance.
Figure 7-2 Differential Output Voltage Test Circuit
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Test Circuit and Definitions for the Driver Common-Mode Output Voltage
A. All input pulses are supplied by a generator having the following characteristics: tr or tf≤ 1 ns, pulse frequency = 1 MHz, duty cycle = 50 ± 5%.
B. C1, C2 and C3 include instrumentation and fixture capacitance within 2 cm of the D.U.T. and are ±20%.
C. R1 and R2 are metal film, surface mount, ±1%, and located within 2 cm of the D.U.T.
D. The measurement of VOS(PP) is made on test equipment with a –3 dB bandwidth of at least 1 GHz.
Figure 7-3 Test Circuit and Definitions for the Driver Common-Mode Output Voltage
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Driver Short-Circuit Test Circuit Figure 7-4 Driver Short-Circuit Test Circuit
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Driver Test Circuit, Timing, and Voltage Definitions for the Differential Output Signal
A. All input pulses are supplied by a generator having the following characteristics: tr or tf≤ 1 ns, frequency = 1 MHz, duty cycle = 50 ± 5%.
B. C1, C2, and C3 include instrumentation and fixture capacitance within 2 cm of the D.U.T. and are ±20%.
C. R1 is a metal film, surface mount, and 1% tolerance and located within 2 cm of the D.U.T.
D. The measurement is made on test equipment with a –3 dB bandwidth of at least 1 GHz.
Figure 7-5 Driver Test Circuit, Timing, and Voltage Definitions for the Differential Output Signal
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Driver Enable and Disable Time Circuit and Definitions
A. All input pulses are supplied by a generator having the following characteristics: tr or tf≤ 1 ns, frequency = 1 MHz, duty cycle = 50 ± 5%.
B. C1, C2, C3, and C4 includes instrumentation and fixture capacitance within 2 cm of the D.U.T. and are ±20%.
C. R1 and R2 are metal film, surface mount, and 1% tolerance and located within 2 cm of the D.U.T.
D. The measurement is made on test equipment with a –3 dB bandwidth of at least 1 GHz.
Figure 7-6 Driver Enable and Disable Time Circuit and Definitions
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Maximum Steady State Output Voltage Figure 7-7 Maximum Steady State Output Voltage
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Driver Jitter Measurement Waveforms
A. All input pulses are supplied by an Agilent 81250 Stimulus System.
B. The measurement is made on a TEK TDS6604 running TDSJIT3 application software
C. Period jitter is measured using a 50 MHz 50 ±1% duty cycle clock input.
D. Peak-to-peak jitter is measured using a 100 Mbps 215 –1 PRBS input.
Figure 7-8 Driver Jitter Measurement Waveforms
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Receiver Voltage and Current Definitions Figure 7-9 Receiver Voltage and Current Definitions
Table 7-1 Type-1 Receiver Input Threshold Test Voltages
APPLIED VOLTAGES RESULTING DIFFERENTIAL
INPUT VOLTAGE		 RESULTING COMMON-
MODE INPUT VOLTAGE		 RECEIVER
(1)OUTPUT
VIA VIB VID VIC
2.400 0.000 2.400 1.200 H
0.000 2.400 –2.400 1.200 L
3.425 3.335 0.050 3.4 H
3.375 3.425 –0.050 3.4 L
–0.975 –1.025 0.050 –1 H
–1.025 –0.975 –0.050 –1 L
(1) H= high level, L = low level, output state assumes receiver is enabled ( RE = L)
Table 7-2 Type-2 Receiver Input Threshold Test Voltages
APPLIED VOLTAGES RESULTING DIFFERENTIAL
INPUT VOLTAGE		 RESULTING COMMON-
MODE INPUT VOLTAGE		 RECEIVER
OUTPUT(1)
VIA VIB VID VIC
2.400 0.000 2.400 1.200 H
0.000 2.400 –2.400 1.200 L
3.475 3.325 0.150 3.4 H
3.425 3.375 0.050 3.4 L
–0.925 –1.075 0.150 –1 H
–0.975 –1.025 0.050 –1 L
(1) H= high level, L = low level, output state assumes receiver is enabled ( RE = L)
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Receiver Timing Test Circuit and Waveforms
A. All input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 1 ns, frequency = 1 MHz, duty cycle = 50 ± 5%. CL is a combination of a 20%-tolerance, low-loss ceramic, surface-mount capacitor and fixture capacitance within 2 cm of the D.U.T.
B. The measurement is made on test equipment with a –3 dB bandwidth of at least 1 GHz.
Figure 7-10 Receiver Timing Test Circuit and Waveforms
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Receiver Enable and Disable Time Test Circuit and Waveforms
A. All input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 1 ns, frequency = 1 MHz, duty cycle = 50 ± 5%.
B. RL is 1% tolerance, metal film, surface mount, and located within 2 cm of the D.U.T.
C. CL is the instrumentation and fixture capacitance within 2 cm of the DUT and ±20%.
Figure 7-11 Receiver Enable and Disable Time Test Circuit and Waveforms
SN65MLVD200A SN65MLVD202A SN65MLVD204A SN65MLVD205A Receiver Jitter Measurement Waveforms
A. All input pulses are supplied by an Agilent 8304A Stimulus System.
B. The measurement is made on a TEK TDS6604 running TDSJIT3 application software
C. Period jitter is measured using a 50 MHz 50 ±1% duty cycle clock input.
D. Peak-to-peak jitter is measured using a 100 Mbps 215 –1 PRBS input.
Figure 7-12 Receiver Jitter Measurement Waveforms