SCAS958 November   2023 SN74AC541

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
    7. 5.7 Typical Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Functional Modes
    4. 7.4 Feature Description
      1. 7.4.1 Balanced CMOS 3-State Outputs
      2. 7.4.2 Standard CMOS Inputs
      3. 7.4.3 Clamp Diode Structure
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
    3. 8.3 Design Requirements
      1. 8.3.1 Power Considerations
      2. 8.3.2 Input Considerations
      3. 8.3.3 Output Considerations
    4. 8.4 Detailed Design Procedure
    5. 8.5 Application Curve
    6. 8.6 Power Supply Recommendations
    7. 8.7 Layout
      1. 8.7.1 Layout Guidelines
      2. 8.7.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • RKS|20
  • DGS|20
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6 Parameter Measurement Information

Phase relationships between waveforms were chosen arbitrarily for the examples listed in the following table. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tt < 2.5 ns.

The outputs are measured individually with one input transition per measurement.

TEST S1 S2 RL CL ΔV VCC
tPLH, tPHL OPEN OPEN — 50 pF — ALL
tPLZ, tPZL CLOSED OPEN 1 kΩ 50 pF 0.15 V ≤ 2.5 V
tPHZ, tPZH OPEN CLOSED 1 kΩ 50 pF 0.15 V ≤ 2.5 V
tPLZ, tPZL CLOSED OPEN 500 Ω 50 pF 0.3 V > 2.5 V
tPHZ, tPZH OPEN CLOSED 500 Ω 50 pF 0.3 V > 2.5 V
GUID-EB3CF292-AF1E-41A1-A556-76EDB85F7F6F-low.gif
(1) CL includes probe and test-fixture capacitance.
Figure 6-1 Load Circuit for 3-State Outputs
GUID-20230721-SS0I-8DSF-V0ZP-LHHGHP0QG4NS-low.svg
(3) The greater between tPZL and tPZH is the same as ten.
(4) The greater between tPLZ and tPHZ is the same as tdis.
Figure 6-3 Voltage Waveforms Propagation Delays
GUID-535BFE0F-9D7B-4CA6-85AB-D09CD11F52EA-low.gif
(1) The greater between tPLH and tPHL is the same as tpd.
Figure 6-2 Voltage Waveforms Propagation Delays
GUID-20200713-CA0I-ZTM5-PTJB-WD0LZ8VNG7PG-low.gif
(1) The greater between tr and tf is the same as tt.
Figure 6-4 Voltage Waveforms, Input and Output Transition Times