SCAS515G June   1995  – March 2024 SN54ACT240 , SN74ACT240

PRODMIX  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 Recommended Operating Conditions
    3. 5.3 Thermal Information
    4. 5.4 Electrical Characteristics
    5. 5.5 Switching Characteristics
    6. 5.6 Operating Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Balanced CMOS Push-Pull Outputs
    4. 7.4 Device Functional Modes
  9. 8 Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
    2. 8.2 Support Resources
    3. 8.3 Trademarks
    4. 8.4 Electrostatic Discharge Caution
    5. 8.5 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • DB|20
  • RKS|20
  • NS|20
  • N|20
  • DGS|20
  • DW|20
  • PW|20
Thermal pad, mechanical data (Package|Pins)
Orderable Information

5.4 Electrical Characteristics

over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS VCC TA= 25°C SN54ACT240 SN74ACT240 UNIT
MIN TYP MAX MIN MAX MIN MAX
VOH IOH = –50 µA 4.5 V 4.4 4.49 4.4 4.4 V
5.5 V 5.4 5.49 5.4 5.4
IOH = –24 mA 4.5 V 3.86 3.7 3.76
5.5 V 4.86 4.7 4.76
IOH = –50 mA (1) 5.5 V 3.85
IOH = –75 mA (1) 5.5 V 3.85
VOL IOL = 50 µA 4.5 V 0.001 0.1 0.1 0.1 V
5.5 V 0.001 0.1 0.1 0.1
IOL = 24 mA 4.5 V 0.36 0.5 0.44
5.5 V 0.36 0.5 0.44
IOL = 50 mA (1) 5.5 V 1.65
IOL = 75 mA (1) 5.5 V 1.65
IOZ VO = VCC or GND 5.5 V ±0.25 ±5 ±2.5 µA
II VI = VCC or GND 5.5 V ±0.1 ±1 ±1 µA
ICC VI = VCC or GND, IO = 0 5.5 V 4 80 40 µA
ΔICC (2) One input at 3.4 V, Other inputs at GND or VCC 5.5 V 0.6 1.6 1.5 mA
Ci VI = VCC or GND 5 V 2.5 pF
CO VI = VCC or GND 5 V 8 pF
(1) Not more than one output should be tested at a time, and the duration of the test should not exceed 2 ms.
(2) This is the increase in supply current for each input that is at one of the specified TTL voltage levels, rather than 0 V or VCC.