SCAS766E April   2004  – March 2024 SN74ACT244-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
    7. 5.7 Operating Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Power Supply Recommendations
    2. 8.2 Layout
      1. 8.2.1 Layout Guidelines
      2. 8.2.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support (Analog)
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • RKS|20
  • PW|20
  • DGS|20
Thermal pad, mechanical data (Package|Pins)
Orderable Information

5.5 Electrical Characteristics

over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS VCC TA = 25°C MIN MAX UNIT
MIN TYP MAX
VOH IOH = −50 µA 4.5 V 4.4 4.49 4.4 V
5.5 V 5.4 5.49 5.4
IOH = −24 mA 4.5 V 3.86 3.76
5.5 V 4.86 4.76
IOH = −75 mA(1) 5.5 V 3.85
VOL IOL = 50 µA 4.5 V 0.001 0.1 0.1 V
5.5 V 0.001 0.1 0.1
IOL = 24 mA 4.5 V 0.36 0.44
5.5 V 0.36 0.44
IOL = 75 mA(1) 5.5 V 1.65
IOZ VO = VCC or GND 5.5 V ±0.25 ±2.5 µA
II VI = VCC or GND 5.5 V ±0.1 ±1 µA
ICC VI = VCC or GND, IO = 0 5.5 V 4 40 µA
∆ICC (2) One input at 3.4 V, Other inputs at GND or VCC 5.5 V 0.6 1.5 mA
Ci VI = VCC or GND 5 V 2.5 pF
Co VI = VCC or GND 5 V 8 pF
(1) Not more than one output should be tested at a time, and the duration of the test should not exceed 2 ms.
(2) This is the increase in supply current for each input that is at one of the specified TTL voltage levels, rather than 0 V or VCC.