SLASFC5 September 2024 TAS2320
ADVANCE INFORMATION
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
AMPLIFIER PERFORMANCE - EXTERNAL PVDD Mode | ||||||
POUT_EXT_PVDD | Maximum Continuous Output Power - 1% THDN | RL = 8 Ω + 33 µH | 8.3 | W | ||
RL = 4 Ω + 33 µH | 14.9 | W | ||||
POUT_EXT_PVDD | Maximum Continuous Output Power - 1% THDN | RL = 8 Ω + 33 µH, HW pin control mode | 8.3 | W | ||
POUT_EXT_PVDD | Maximum Continuous Output Power - 10% THDN | RL = 8 Ω + 33 µH | 10.3 | W | ||
RL = 4 Ω + 33 µH | 18.4 | W | ||||
RL = 4 Ω + 33 µH, PVDD=14V | 24.5 | W | ||||
ηSYSTEM_EXT_0.5W | System Efficiency at POUT = 0.5W | RL = 8 Ω + 33 µH | 83.9 | % | ||
RL = 4 Ω + 33 µH | 80.0 | % | ||||
ηSYSTEM__EXT_1W | System Efficiency at POUT = 1.0W | RL = 8 Ω + 33 µH | 88.1 | % | ||
RL = 4 Ω + 33 µH | 84.2 | % | ||||
ηSYSTEM__EXT_1W | System Efficiency at POUT = 1.0W | RL = 8 Ω + 33 µH, HW pin control mode | 88.1 | % | ||
ηSYSTEM_EXT_MAX_POUT | System Efficiency at 1% THD+N power Level | RL = 8 Ω + 33 µH | 93.2 | % | ||
RL = 4 Ω + 33 µH | 88.5 | % | ||||
ηSYSTEM_EXT_MAX_POUT | System Efficiency at 1% THD+N power Level | RL = 8 Ω + 33 µH, HW pin control mode | 93.2 | % | ||
VN_EXT | Idle channel Noise | A-Weighted, Gain = 21dBV (Speaker Mode), DAC-Running | 14.4 | µV | ||
DNR_EXT | Dynamic Range | A-Weighted, -60 dBFS Method, RL = 8 Ω + 33 µH | 114.4 | dB | ||
THD+N_EXT | Total Harmonic distortion + Noise | POUT = 1 W, RL = 8 Ω + 33 µH, fin = 1 kHz | 0.003 | % | ||
POUT = 1 W, RL = 4 Ω + 33 µH, fin = 1 kHz | 0.004 | % | ||||
KCP_EXT | Click and pop performance | All dynamic power up/downs of audio channel except for faults. Includes In/Out of Mute, Power Up and power Down, Noise Gate mode entry and Exit. Measured at Peak A-weighted Voltage. RL = 8 Ω + 33 µH, Input = Digital Silience | –68 | dBV | ||
VOS_EXT | Output Offset Voltage | Idle channel | –1 | 1 | mV | |
PSRRPVDD_EXT | PVDD power-supply rejection ratio | PVDD = 12 V + 200 mVpp, fripple = 217 Hz | 115 | dB | ||
PVDD = 12 V + 200 mVpp, fripple = 1 kHz | 115 | dB | ||||
PVDD = 12 V + 200 mVpp, fripple = 20 kHz | 95 | dB | ||||
PSRRVBAT_EXT | VBAT power-supply rejection ratio | VBAT = 3.6 V + 200 mVpp, fripple = 217 Hz | 115 | dB | ||
VBAT = 3.6 V + 200 mVpp, fripple = 1 kHz | 115 | dB | ||||
VBAT = 3.6 V + 200 mVpp, fripple = 20 kHz | 90 | dB | ||||
PSRRVDD_EXT | VDD power-supply rejection ratio | VDD = 1.8 V + 200 mVpp, fripple = 217 Hz | 110 | dB | ||
VDD = 1.8 V + 200 mVpp, fripple = 1 kHz | 110 | dB | ||||
VDD = 1.8 V + 200 mVpp, fripple = 20 kHz | 90 | dB | ||||
TDM Serial Port | ||||||
PCM Sample Rates and FSYNC Input Frequency | 16 | 192 | kHz | |||
SBCLK Input Frequency | I2S/TDM Operation | 0.512 | 24.57 | MHz | ||
SBCLK Maximum Input Jitter | RMS Jitter below 40 kHz that can be tolerated without performance degradation | 0.5 | ns | |||
RMS Jitter above 40 kHz that can be tolerated without performance degradation | 5 | ns | ||||
SBCLK Cycles per FSYNC in I2S and TDM Modes | Values: 64, 96, 128, 192, 256, 384 and 512 | 64 | 512 | Cycles | ||
PCM Playback Characteristics to fs ≤ 48 kHz | ||||||
fs | Sample Rates | 16 | 48 | kHz | ||
Audio Channel Passband LPF Corner | Ripple < pass-band ripple | 0.454 | fs | |||
Audio Channel Passband Ripple | 20 Hz to LPF cutoff | ± 0.1 | dB | |||
Audio Channel Stop Band Attenuation | ≥ 0.55 fs | 60 | dB | |||
≥ 1 fs | 65 | dB | ||||
Audio Channel Group Delay | Fin = 1kHz, Class-H mode | 31.5 | 1/fs | |||
Fin = 1kHz, Class-H bypassed | 6.5 | 1/fs | ||||
DC to 20kHz, HPF bypassed, Class-H bypassed | 11.0 | 1/fs | ||||
DC to 20kHz, HPF bypassed, Class-H mode | 37.0 | 1/fs | ||||
PCM Playback Characteristics to fs > 48 kHz | ||||||
fs | Sample Rates | 88.2 | 192 | kHz | ||
Audio Channel Passband LPF Corner | fs = 96 kHz | 0.469 | fs | |||
fs = 192 kHz | 0.234 | fs | ||||
Audio Channel Passband Ripple | 20 Hz to LPF cutoff | ± 0.2 | dB | |||
Audio Channel Stop Band Attenuation | fs = 96 kHz, fin ≥ 0.55 fs | 60 | dB | |||
fs = 96 kHz, fin ≥ 1 fs | 65 | dB | ||||
fs = 192 kHz, 0.55 fs ≥ fin ≥ 0.275 fs | 60 | dB | ||||
Audio Channel Group Delay | fin=1kHz, fs=96 kHz, Class-H mode | 56.7 | 1/fs | |||
DC to 40kHz, fs=96 kHz, HPF Bypassed, Class-H bypassed | 8.6 | 1/fs | ||||
DC to 40kHz, fs=192 kHz, HPF Bypassed, Class-H Mode | 117.8 | 1/fs | ||||
Protection Circuits | ||||||
Thermal shutdown temperature | 140 | °C | ||||
Thermal shutdown retry time | 1.5 | s | ||||
VBAT undervoltage lockout threshold (UVLO) | UVLO is asserted | 1.9 | V | |||
UVLO is released | 2.3 | V | ||||
VDD undervoltage lockout threshold (UVLO) | UVLO is asserted | 1.4 | V | |||
UVLO is released | 1.6 | V | ||||
PVDD undervoltage lockout threshold (UVLO) | UVLO is asserted, external PVDD mode only | 2.6 | V | |||
UVLO is released, external PVDD mode only | 2.8 | V | ||||
PVDD overvoltage lockout threshold (OVLO) | OVLO is asserted, OVLO protection enabled. | 16 | V | |||
Output Short circuit protection | Output to Output, Output to GND, Output to PVDD, Output to VBAT, H-bridge mode | 4.1 | A | |||
Power up/down Time | ||||||
TSTDBY | Turn ON time from SDZ Asserted to device ready for i2c Command | 300 | us | |||
TACTIVE | Turn ON time from release of Software Shutdown to Amplifier output Active | Volume ramping disabled | 1.6 | ms | ||
Volume ramping enabled | 3.9 | ms | ||||
TTURNOFF | Turn OFF time from assertion of Software Shutdown to Amplifier output Hi-Z | Volume ramping disabled | 0.2 | ms | ||
Volume ramping enabled | 13.9 | ms | ||||
Current Consumption - External PVDD Mode | ||||||
IQ_HW_SD | Current consumption in Hardware Shutdown | PVDD, SDZ=0 | 1 | uA | ||
VBAT, SDZ=0 | 0.1 | uA | ||||
VDD, SDZ=0 | 0.2 | uA | ||||
IOVDD, SDZ=0 | 0.1 | uA | ||||
IQ_SW_SD | Current consumption in Software Shutdown | PVDD, All clocks Stopped | 1 | uA | ||
VBAT, All clocks Stopped | 0.1 | uA | ||||
VDD, All clocks Stopped | 12 | uA | ||||
IOVDD, All clocks Stopped | 0.1 | uA | ||||
IQ_NG | Current consumption in Idle channel | PVDD, POUT = 0, Noise gate enabled | 0.1 | mA | ||
VBAT, POUT = 0, Noise gate enabled | 0.15 | mA | ||||
VDD, POUT = 0, Noise gate enabled | 2.2 | mA | ||||
IOVDD, POUT = 0, Noise gate enabled | 0.1 | mA | ||||
Total Power, POUT = 0, Noise gate enabled | 5.3 | mW | ||||
IQ_IDLE | Current consumption in Idle channel | PVDD, POUT = 0, Noise gate disabled | 0.2 | mA | ||
VBAT, POUT = 0, Noise gate disabled | 0.5 | mA | ||||
VDD, POUT = 0, Noise gate disabled | 5.6 | mA | ||||
IOVDD, POUT = 0, Noise gate disabled | 0.1 | mA | ||||
Total Power, POUT = 0, Noise gate disabled | 14.0 | mW | ||||
IQ_IDLE | Current consumption in Idle channel, , HW pin control mode | PVDD, POUT = 0, Noise gate disabled | mA | |||
VBAT, POUT = 0, Noise gate disabled | mA | |||||
VDD, POUT = 0, Noise gate disabled | mA | |||||
IOVDD, POUT = 0, Noise gate disabled | mA | |||||
Total Power, POUT = 0, Noise gate disabled | mW | |||||
DIGITAL IOs | ||||||
VIH | High-level digital input logic voltage threshold | All digital pins | 0.7 x IOVDD | V | ||
VIL | Low-level digital input logic voltage threshold | All digital pins | 0.3 x IOVDD | V | ||
VOH | High-level digital output voltage | All digital pins except SDA, SCL and IRQZ; IOH = 100µA | IOVDD - 0.2 V | V | ||
VOL | Low-level digital output voltage | All digital pins except SDA, SCL and IRQZ; IOL = -100µA | 0.2 | V | ||
VOL(I2C) | Low-level digital output voltage | SDA and SCL; IOL = -1mA | 0.2 x IOVDD | V | ||
VOL(IRQZ) | Low-level digital output voltage for open drain output | IRQZ pin; IOL = -1mA | 0.2 | V | ||
IIH | Input logic-high leakage for digital inputs | All digital pins; Input = IOVDD. | -1 | 1 | µA | |
IIL | Input logic-low leakage for digital inputs | All digital pins; Input = GND | -1 | 1 | µA | |
CIN | Input capacitance for digital inputs | All digital pins | 5 | pF | ||
RPD | Pull down resistance for digital input/IO pins when asserted on | All digital pins. Pull down resistance option enabled | 18 | kΩ |