SLOSE75B February 2022 – March 2023 TAS2780
PRODUCTION DATA
During the power-up sequence, the circuit monitoring the AVDD pin will hold the device in reset (including all configuration registers) until the supply is valid. The device will not exit hardware shutdown until AVDD is valid and the SDZ pin is released. Once SDZ is released, the digital core voltage regulator will power up, enabling detection of the operational mode. If AVDD dips below the under voltage threshold, the device will immediately be forced into a reset state.
The device also monitors the PVDD supply and holds the analog core in power down if the supply is below the PVDD under voltage threshold (set by register bits PVDD_UVLO_TH[5:0]). If the TAS2780 is in active operation and an under voltage fault occurs, the analog blocks will immediately be powered down to protect the device. These faults are latched and require a transition through Hardware or Software Shutdown to clear the fault. The latched registers will report under voltage faults.
The device transitions into Software Shutdown mode if it detects any faults with the TDM clocks such as:
• Invalid SBCLK to FSYNC ratio
• Invalid FSYNC frequency
• Halting of SBCLK or FSYNC clocks
Upon detection of a TDM clock error, the device transitions into Software Shutdown mode as quickly as possible to limit the possibility of audio artifacts. Once all TDM clock errors are resolved, the device volume ramps back to its previous playback state. During a TDM clock error, the IRQZ pin will assert low if the clock error interrupt mask register bit IM_TDMCE is set low. The clock fault is also available for read-back in the latched fault status register (bit IR_TDMCE]).
The TAS2780 also monitors die temperature and Class-D load current and will enter Software Shutdown mode if either of these exceed safe values. As with the TDM clock error, the IRQZ pin will assert low for these faults if the fault interrupt mask register bit is set low for over temperature and for over current. The fault status can also be monitored in the latched fault registers.
Die over temperature and Class-D over current errors can either be latching (for example, the device will enter Software Shutdown until a Hardware or Software Shutdown sequence is applied) or they can be programmed to automatically retry after a prescribed time. This behavior can be configured in the OTE_RETRY, OCE_RETRY register bits (for over temperature and over current respectively). Even in latched mode, the Class-D will not attempt to retry after an over temperature or over current error until the retry time period (1.5 s) has elapsed. This prevents applying repeated stress to the device in a rapid fashion that could lead to device damage. If the device has been cycled through a Hardware or Software Shutdown, it will only begin to operate after the retry time period.
By default all retry features are disabled.
When exiting Software Shutdown to Active mode (for example: MODE[2:0] bits from 010b to 000b), if PVDD under voltage is detected, the device will go back into Software Shutdown mode and an interrupt (IL_PUVLO) will be flagged. To exit this fault user needs to clear the interrupt and program the device in Software Shutdown using MODE[2:0] bits, before making another attempt to go to Active mode.
A similar situation might occur in PWR_MODE2, if internal VBAT1S LDO undervoltage is detected and IL_LDO_UV interrupt is flagged.
The status registers (and IRQZ pin, if enabled via the status mask register) also indicate limiter behavior including when the limiter is activated, when PVDD is below the inflection point, when maximum attenuation has been applied, when the limiter is in infinite hold and when the limiter has muted the audio.
In situations when the device operates in PWR_MODE2 the VBAT1S pin is supplied by an internal LDO. Protection circuits monitor this block and generate faults in case of under voltage, over voltage or if the LDO is over loaded. The device goes into Software Shutdown mode if one of these faults triggers.
The IRQZ pin is an open drain output that asserts low during unmasked fault conditions and therefore must be pulled up with a resistor to IOVDD. An internal pull up resistor is provided and can be accessed (connected to the pin) by setting the IRQZ_PU register bit high.
The IRQZ interrupt configuration can be set using IRQZ_PIN_CFG[1:0] register bits. The IRQZ_POL register bit sets the interrupt polarity.
The INT_LTCH_CLR register bit allows to clear all the interrupt latch register bits.
Live flag registers are active only when the device is in Active mode of operation. If the device is shutdown by I2C command or due to any fault condition described below, the live flags will be reset. Latched flags will not be reset in this condition and available for user to read their status.
Interrupt | Live Register Bit | Latch Register Bit | Mask Register Bit | Default (1 = Mask) |
---|---|---|---|---|
Temp Over 105°C | IL_TO105 | IR_TO105 | IM_TO105 | 1 |
Temp Over 115°C | IL_TO115 | IR_TO115 | IM_TO115 | 1 |
Temp Over 125°C | IL_TO125 | IR_TO125 | IM_TO125 | 1 |
Temp Over 135°C | IL_TO135 | IR_TO135 | IM_TO135 | 1 |
Over Temp Error | Device in shutdown | IR_OT | IM_OT | 0 |
Over Current Error | Device in shutdown | IR_OC | IM_OC | 0 |
TDM Clock Error | Device in shutdown | IR_TDMCE | IM_TDMCE | 1 |
TDM Clock Error: Invalid SBCLK ratio or FS rate | IR_TDMCEIR | |||
TDM Clock Error: FS changed on the fly | IR_TDNCEFC | |||
TDM Clock Error: SBCLK FS ratio changed on the fly | IR_TDMCERC | |||
BOP Active | IL_BOPA | IR_BOPA | IM_BOPA | 0 |
BOP Level 0 Active | IL_BOPL0A | IR_BOPL0A | IM_BOPL0A | 0 |
BOP Level 1 Active | IL_BOPL1A | IR_BOPL1A | IM_BOPL1A | 0 |
BOP Level 2 Active | IL_BOPL2A | IR_BOPL2A | IM_BOPL2A | 0 |
BOP Level 3 Active | IL_BOPL3A | IR_BOPL3A | IM_BOPL3A | 0 |
BOP Infinite Hold | IL_BOPIH | IR_BOPIH | IM_BOPIH | 1 |
BOP Mute | IL_BOPM | IR_BOPM | IM_BOPM | 1 |
PVDD Below LImiter Inflection | IL_PBIP | IR_PBIP | IM_PBIP | 1 |
Limiter Active | IL_LIMA | IR_LIMA | IM_LIMA | 1 |
Limiter Max Atten | IL_LIMMA | IR_LIMMA | IM_LIMMA | 1 |
PVDD UVLO | Device in shutdown | IR_PUVLO | IM_PUVLO | 0 |
VBAT1S UVLO | Device in shutdown | IR_VBAT1S_UVLO | IM_VBAT1S_UVLO | 0 |
OTP CRC Error | Device in shutdown | IR_OTPCRC | ||
VBAT Gain Limiter | IL_VBATLIM | IR_VBATLIM | IM_VBATLIM | 1 |
Load Diagnostic Complete | IR_LDC | IM_LDC | 1 | |
Load Diagnostic Mode Fault | IR_LDMODE[1:0] | IM_LDMODE[1:0] | 11 | |
Internal PLL Clock Error | Device in shutdown | IR_PLL_CLK | IM_PLL_CLK | 1 |
Noise Gate Active | IL_NGA | |||
PVDD-VBAT1S Below Threshold | IL_PVBT | IR_PVBT | IM_PVBT | 0 |
Internal VBAT1S LDO Over Voltage | Device in shutdown | IR_LDO_OV | IM_LDO_OV | 1 |
Internal VBAT1S LDO Under Voltage | Device in shutdown | IR_LDO_UV | IM_LDO_UV | 0 |
Internal VBAT1S LDO Over Load | Device in shutdown | IR_LDO_OL | IM_LDO_OL | 1 |
Thermal Detection Threshold 2 | Device in shutdown | IR_TDTH2 | IM_TDTH2 | 0 |
Thermal Detection Threshold 1 | IL_TDTH1 | IR_TDTH1 | IM_TDTH1 | 0 |