SLOS838C July 2013 – August 2015 TAS5731M
PRODUCTION DATA.
MIN | MAX | UNIT | ||
---|---|---|---|---|
Supply voltage | DVDD, AVDD | –0.3 | 4.2 | V |
PVDD_x | –0.3 | 30 | V | |
Input voltage | 3.3-V digital input | –0.5 | DVDD + 0.5 | V |
5-V tolerant(2) digital input (except MCLK) | –0.5 | DVDD + 2.5(4) | ||
5-V tolerant MCLK input | –0.5 | AVDD + 2.5(4) | ||
OUT_x to PGND_x | 32(3) | V | ||
BST_x to PGND_x | 39(3) | V | ||
Input clamp current, IIK | –20 | 20 | mA | |
Output clamp current, IOK | –20 | 20 | mA | |
Operating free-air temperature | 0 | 85 | °C | |
Operating junction temperature | 0 | 150 | °C | |
Storage temperature, Tstg | –40 | 125 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±1000 | V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±250 |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
Digital/analog supply voltage | DVDD, AVDD | 3 | 3.3 | 3.6 | V | |
Half-bridge supply voltage | PVDD_x | 8 | 26.4(2) | V | ||
VIH | High-level input voltage | 5-V tolerant | 2 | V | ||
VIL | Low-level input voltage | 5-V tolerant | 0.8 | V | ||
TA | Operating ambient temperature range | 0 | 85 | °C | ||
TJ(1) | Operating junction temperature range | 0 | 125 | °C | ||
RL (PBTL) | Load impedance | Output filter: L = 15 μH, C = 680 nF | 2 | Ω | ||
RL (BTL) | Load impedance | Output filter: L = 15 μH, C = 680 nF | 4 | Ω | ||
RL (SE) | Load impedance | Output filter: L = 15 μH, C = 680 nF | 2 | Ω | ||
LO | Output-filter inductance | Minimum output inductance under short-circuit condition | 10 | μH |
THERMAL METRIC(1) | TAS5731M | UNIT | |
---|---|---|---|
PHP (HTQFP) | |||
48 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 27.9 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 1.1 | °C/W |
RθJB | Junction-to-board thermal resistance | 13 | °C/W |
ψJT | Junction-to-top characterization parameter | 20.7 | °C/W |
ψJB | Junction-to-board characterization parameter | 0.3 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | 6.7 | °C/W |
PARAMETER | TEST CONDITIONS | VALUE | UNIT |
---|---|---|---|
Output PWM switch frequency | 11.025/22.05/44.1-kHz data rate ±2% | 352.8 | kHz |
48/24/12/8/16/32-kHz data rate ±2% | 384 |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
VOH | High-level output voltage | ADR/FAULT and SDA | IOH = –4 mA DVDD = 3 V |
2.4 | V | ||
VOL | Low-level output voltage | ADR/FAULT and SDA | IOL = 4 mA DVDD = 3 V |
0.5 | V | ||
IIL | Low-level input current | VI < VIL; DVDD = AVDD = 3.6 V |
75 | μA | |||
IIH | High-level input current | VI > VIH; DVDD = AVDD = 3.6 V |
75(3) | μA | |||
IDD | 3.3-V supply current | 3.3-V supply voltage (DVDD, AVDD) | Normal mode | 49 | 68 | mA | |
Reset (RESET = low, PDN = high) | 23 | 38 | |||||
IPVDD | Supply current | No load (PVDD_x) | Normal mode | 32 | 50 | mA | |
Reset (RESET = low, PDN = high) | 4 | 8 | |||||
rDS(on)(2) | Drain-to-source resistance, LS | TJ = 25°C, includes metallization resistance | 80 | mΩ | |||
Drain-to-source resistance, HS | TJ = 25°C, includes metallization resistance | 80 | |||||
I/O PROTECTION | |||||||
Vuvp | Undervoltage protection limit | PVDD falling | 6.4 | V | |||
Vuvp,hyst | Undervoltage protection limit | PVDD rising | 7.1 | V | |||
OTE(1) | Overtemperature error | 150 | °C | ||||
OTEHYST(1) | Extra temperature drop required to recover from error | 30 | °C | ||||
IOC | Overcurrent limit protection | Output to output short in BTL mode | 4.5 | A | |||
IOCT | Overcurrent response time | 150 | ns |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
PO | Power output per channel | BTL mode, PVDD = 8 V, RL = 8 Ω, 7% THD | 3.9 | W | ||
BTL mode, PVDD = 8 V, RL = 8 Ω,10% THD | 4.2 | |||||
BTL mode, PVDD = 12 V, RL = 8 Ω, 7% THD | 8 | |||||
BTL mode, PVDD = 12 V, RL = 8 Ω,10% THD | 9.6 | |||||
BTL mode, PVDD = 18 V, RL = 8 Ω, 7% THD | 18.7 | |||||
BTL mode, PVDD = 18 V, RL = 8 Ω, 10% THD | 21.2 | |||||
BTL mode, PVDD = 24 V, RL = 8 Ω, 7% THD | 32.6 | |||||
BTL mode, PVDD = 24 V, RL = 8 Ω, 10% THD | 37.2 | |||||
PBTL mode, PVDD = 12 V, RL = 4 Ω, 7% THD | 16.5 | |||||
PBTL mode, PVDD = 12 V, RL = 4 Ω, 10% THD | 17.9 | |||||
PBTL mode, PVDD = 18 V, RL = 4 Ω, 7% THD | 37 | |||||
PBTL mode, PVDD = 18 V, RL = 4 Ω, 10% THD | 39.6 | |||||
PBTL mode, PVDD = 24 V, RL = 4 Ω, 10% THD | 66 | |||||
PBTL mode, PVDD = 24 V, RL = 4 Ω, 10% THD | 69.6 | |||||
SE Mode, PVDD = 12 V, RL = 4 Ω, 7% THD | 4.2 | |||||
SE Mode, PVDD = 12 V, RL = 4 Ω, 10% THD | 4.6 | |||||
SE Mode, PVDD = 18 V, RL = 4 Ω, 7% THD | 9.6 | |||||
SE Mode, PVDD = 18 V, RL = 4 Ω, 10% THD | 10.2 | |||||
SE Mode, PVDD = 24 V, RL = 4 Ω, 7% THD | 17.1 | |||||
SE Mode, PVDD = 24 V, RL = 4 Ω, 10% THD | 18.1 | |||||
THD+N | Total harmonic distortion + noise | PVDD = 8 V, PO = 1 W | 0.15% | |||
PVDD = 12 V, PO = 1 W | 0.03% | |||||
PVDD = 18 V, PO = 1 W | 0.04% | |||||
PVDD = 24 V, PO = 1 W | 0.1% | |||||
Vn | Output integrated noise (rms) | A-weighted | 46 | μV | ||
Cross-talk | PO = 0.25 W, f = 1 kHz (AD Mode) | –67 | dB | |||
SNR | Signal-to-noise ratio(1) | A-weighted, f = 1 kHz, maximum power at THD < 1% |
104 | dB |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
External PLL filter capacitor C1 | SMD 0603 X7R | 47 | nF | |||
External PLL filter capacitor C2 | SMD 0603 X7R | 4.7 | nF | |||
External PLL filter resistor R | SMD 0603, metal film | 470 | Ω |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
CL | Load capacitance for each bus line | 400 | pF |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
fMCLKI | MCLK frequency | 2.8224 | 24.576 | MHz | ||
MCLK duty cycle | 40% | 50% | 60% | |||
tr/tf(MCLK) | Rise/fall time for MCLK | 5 | ns | |||
LRCLK allowable drift before LRCLK reset | 4 | MCLKs |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
fSCLKIN | Frequency, SCLK 32 × fS, 48 × fS, 64 × fS | CL = 30 pF | 1.024 | 12.288 | MHz | |
tsu1 | Setup time, LRCLK to SCLK rising edge | 10 | ns | |||
th1 | Hold time, LRCLK from SCLK rising edge | 10 | ns | |||
tsu2 | Setup time, SDIN to SCLK rising edge | 10 | ns | |||
th2 | Hold time, SDIN from SCLK rising edge | 10 | ns | |||
LRCLK frequency | 8 | 48 | 48 | kHz | ||
SCLK duty cycle | 40% | 50% | 60% | |||
LRCLK duty cycle | 40% | 50% | 60% | |||
SCLK rising edges between LRCLK rising edges | 32 | 64 | SCLK edges | |||
t(edge) | LRCLK clock edge with respect to the falling edge of SCLK | –1/4 | 1/4 | SCLK period | ||
tr/tf | Rise/fall time for SCLK/LRCLK | 8 | ns |
PARAMETER | TEST CONDITIONS | MIN | MAX | UNIT | |
---|---|---|---|---|---|
fSCL | Frequency, SCL | No wait states | 400 | kHz | |
tw(H) | Pulse duration, SCL high | 0.6 | μs | ||
tw(L) | Pulse duration, SCL low | 1.3 | μs | ||
tr | Rise time, SCL and SDA | 300 | ns | ||
tf | Fall time, SCL and SDA | 300 | ns | ||
tsu1 | Setup time, SDA to SCL | 100 | ns | ||
th1 | Hold time, SCL to SDA | 0 | ns | ||
t(buf) | Bus free time between stop and start conditions | 1.3 | μs | ||
tsu2 | Setup time, SCL to start condition | 0.6 | μs | ||
th2 | Hold time, start condition to SCL | 0.6 | μs | ||
tsu3 | Setup time, SCL to stop condition | 0.6 | μs |
PARAMETER | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|
tw(RESET) | Pulse duration, RESET active | 100 | μs | ||
td(I2C_ready) | Time to enable I2C | 12 | ms |
NOTES:
On power up, it is recommended that the TAS5731M RESET be held LOW for at least 100 μs after DVDD has reached 3 V.